Series Resistance and Mobility Extraction Method in Nanoscale MOSFETs

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Bibliographic Details
Published in:Journal of the Electrochemical Society 2009, Vol.156 (1), p.H34
Main Authors: Chen, William Po-Nien, Su, Pin, Goto, Ken-Ichi, Diaz, Carlos H.
Format: Article
Language:English
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ISSN:0013-4651
DOI:10.1149/1.3005569