Impact of Gate Dielectric in Carrier Mobility in Low Temperature Chalcogenide Thin Film Transistors for Flexible Electronics

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Bibliographic Details
Published in:Electrochemical and solid-state letters 2010, Vol.13 (9), p.H313
Main Authors: Salas-Villasenor, A. L., Mejia, I., Hovarth, J., Alshareef, H. N., Cha, D. K., Ramirez-Bon, R., Gnade, B. E., Quevedo-Lopez, M. A.
Format: Article
Language:English
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ISSN:1099-0062
DOI:10.1149/1.3456551