Investigation of Light-Induced Bias Instability in Hf-In-Zn-O Thin Film Transistors: A Cation Combinatorial Approach

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Bibliographic Details
Published in:Journal of the Electrochemical Society 2011, Vol.158 (4), p.H433
Main Authors: Kwon, Jang-Yeon, Jung, Ji Sim, Son, Kyoung Seok, Lee, Kwang-Hee, Park, Joon Seok, Kim, Tae Sang, Park, Jin-Seong, Choi, Rino, Jeong, Jae Kyeong, Koo, Bonwon, Lee, Sangyun
Format: Article
Language:English
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ISSN:0013-4651
DOI:10.1149/1.3552700