(Invited) Low Frequency Noise Performance of State-of-the-Art and Emerging CMOS Devices

The development of future CMOS technologies in line with the ITRS roadmap necessitates not only a scaling of the critical device dimensions but also implies the introduction of new materials and even switching over to alternative horizontal, vertical or 3D device architectures. This paper aims to gi...

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Bibliographic Details
Published in:ECS transactions 2012-04, Vol.45 (3), p.567-580
Main Authors: Claeys, Cor, Aoulaiche, Marc, Andrade, M.G. C., Rodrigues, Michele, Martino, Joao Antonio, Simoen, Eddy
Format: Article
Language:English
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Summary:The development of future CMOS technologies in line with the ITRS roadmap necessitates not only a scaling of the critical device dimensions but also implies the introduction of new materials and even switching over to alternative horizontal, vertical or 3D device architectures. This paper aims to give an overview of the impact of some of these approaches on the low frequency noise performance and to give an outlook for the future.
ISSN:1938-5862
1938-6737
DOI:10.1149/1.3700921