Dielectric Properties of SnO 2 Thin Film Using SPR Technique for Gas Sensing Applications

Focus has been made on the determination of dielectric constant of thin dielectric layer (SnO 2 thin film) using surface plasmon resonance (SPR) technique and exploiting it for the detection of NH 3 gas. SnO 2 thin film has been deposited by rf-sputtering technique on gold coated glass prism (BK-7)...

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Bibliographic Details
Published in:Conference Papers in Science 2014-05, Vol.2014, p.1-4
Main Authors: Paliwal, Ayushi, Sharma, Anjali, Tomar, Monika, Gupta, Vinay
Format: Article
Language:English
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Summary:Focus has been made on the determination of dielectric constant of thin dielectric layer (SnO 2 thin film) using surface plasmon resonance (SPR) technique and exploiting it for the detection of NH 3 gas. SnO 2 thin film has been deposited by rf-sputtering technique on gold coated glass prism (BK-7) and its SPR response was measured in the Kretschmann configuration of attenuated total reflection using a p-polarised light beam at 633 nm wavelength. The SPR response of bilayer film was fitted with Fresnel’s equations in order to calculate the dielectric constant of SnO 2 thin film. The air/SnO 2 /Au/prim system has been utilized for detecting varying concentration (500 ppm to 2000 ppm) of NH 3 gas at room temperature using SPR technique. SPR curve shows significant shift in resonance angle from 44.8° to 56.7° on exposure of fixed concentration of NH 3 gas (500 ppm to 2000 ppm) with very fast response and recovery speeds.
ISSN:2356-6108
2356-6094
DOI:10.1155/2014/656120