Synchronous fluctuation in broad-band processes and application to the electroencephalographic brain data

We propose phase-like characteristics in the broad-band process and introduce a novel wavelet-based method to analyze fluctuation in synchrony (FIS) in a wide frequency range. We demonstrate FIS between multifractal processes and a modeled dynamical system in phase transition. We then apply the idea...

Full description

Saved in:
Bibliographic Details
Published in:Europhysics letters 2012-02, Vol.97 (4), p.40001
Main Authors: Lin, D. C., Perez Velazquez, J. L., Nenadovic, V.
Format: Article
Language:English
Subjects:
05.45.Tp
05.45.Xt
87.19.lm
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:We propose phase-like characteristics in the broad-band process and introduce a novel wavelet-based method to analyze fluctuation in synchrony (FIS) in a wide frequency range. We demonstrate FIS between multifractal processes and a modeled dynamical system in phase transition. We then apply the idea to analyze surface scalp electroencephalographic data from normal subjects and traumatic brain-injured (TBI) patients. Our results show that FIS in normal subjects is more pronounced and exhibits more dynamic spatiotemporal patterns. Moreover, we find an intrinsic synchrony-variability relationship underlying these FIS characteristics.
ISSN:0295-5075
1286-4854
DOI:10.1209/0295-5075/97/40001