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Terahertz profilometry at 600 GHz with 05 μm depth resolution

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Bibliographic Details
Published in:	Optics express 2008-07, Vol.16 (15), p.11289
Main Authors:	Hils, Bernd, Thomson, Mark D., Löffler, Torsten, Spiegel, Wolff von, Weg, Christian am, Roskos, Hartmut G., Maagt, Peter de, Doyle, Dominic, Geckeler, Ralf D.
Format:	Article
Language:	English
Citations:	Items that this one cites Items that cite this one
Online Access:	Get full text
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