Terahertz profilometry at 600 GHz with 05 μm depth resolution

Saved in:
Bibliographic Details
Published in:Optics express 2008-07, Vol.16 (15), p.11289
Main Authors: Hils, Bernd, Thomson, Mark D., Löffler, Torsten, Spiegel, Wolff von, Weg, Christian am, Roskos, Hartmut G., Maagt, Peter de, Doyle, Dominic, Geckeler, Ralf D.
Format: Article
Language:English
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by cdi_FETCH-LOGICAL-c273t-debd18f2a2c1a0bab41e7d2bc6d34be65f9c18b07108c08e82c69f1163037f353
cites cdi_FETCH-LOGICAL-c273t-debd18f2a2c1a0bab41e7d2bc6d34be65f9c18b07108c08e82c69f1163037f353
container_end_page
container_issue 15
container_start_page 11289
container_title Optics express
container_volume 16
creator Hils, Bernd
Thomson, Mark D.
Löffler, Torsten
Spiegel, Wolff von
Weg, Christian am
Roskos, Hartmut G.
Maagt, Peter de
Doyle, Dominic
Geckeler, Ralf D.
description
doi_str_mv 10.1364/OE.16.011289
format article
fullrecord <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1364_OE_16_011289</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1364_OE_16_011289</sourcerecordid><originalsourceid>FETCH-LOGICAL-c273t-debd18f2a2c1a0bab41e7d2bc6d34be65f9c18b07108c08e82c69f1163037f353</originalsourceid><addsrcrecordid>eNpNj0FKxDAYRoMoOI7uPEAOYOv_J2mSbgQZ6oww0M24LkmaMJXWlqQiM2fzDJ5JZVy4et_bfPAIuUXIkUtxX1c5yhwQmS7PyAKhFJkArc7_7UtyldIrAApVqgV52Plo9j7ORzrFMXT9OPg5HqiZqQSg682RfnTznkJBvz4H2vrpR6JPY_8-d-PbNbkIpk_-5o9L8vJU7VabbFuvn1eP28wxxees9bZFHZhhDg1YYwV61TLrZMuF9bIIpUNtQSFoB9pr5mQZECUHrgIv-JLcnX5dHFOKPjRT7AYTDw1C89ve1FWDsjm1828N9kvu</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Terahertz profilometry at 600 GHz with 05 μm depth resolution</title><source>Free E-Journal (出版社公開部分のみ）</source><creator>Hils, Bernd ; Thomson, Mark D. ; Löffler, Torsten ; Spiegel, Wolff von ; Weg, Christian am ; Roskos, Hartmut G. ; Maagt, Peter de ; Doyle, Dominic ; Geckeler, Ralf D.</creator><creatorcontrib>Hils, Bernd ; Thomson, Mark D. ; Löffler, Torsten ; Spiegel, Wolff von ; Weg, Christian am ; Roskos, Hartmut G. ; Maagt, Peter de ; Doyle, Dominic ; Geckeler, Ralf D.</creatorcontrib><identifier>ISSN: 1094-4087</identifier><identifier>EISSN: 1094-4087</identifier><identifier>DOI: 10.1364/OE.16.011289</identifier><language>eng</language><ispartof>Optics express, 2008-07, Vol.16 (15), p.11289</ispartof><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c273t-debd18f2a2c1a0bab41e7d2bc6d34be65f9c18b07108c08e82c69f1163037f353</citedby><cites>FETCH-LOGICAL-c273t-debd18f2a2c1a0bab41e7d2bc6d34be65f9c18b07108c08e82c69f1163037f353</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Hils, Bernd</creatorcontrib><creatorcontrib>Thomson, Mark D.</creatorcontrib><creatorcontrib>Löffler, Torsten</creatorcontrib><creatorcontrib>Spiegel, Wolff von</creatorcontrib><creatorcontrib>Weg, Christian am</creatorcontrib><creatorcontrib>Roskos, Hartmut G.</creatorcontrib><creatorcontrib>Maagt, Peter de</creatorcontrib><creatorcontrib>Doyle, Dominic</creatorcontrib><creatorcontrib>Geckeler, Ralf D.</creatorcontrib><title>Terahertz profilometry at 600 GHz with 05 μm depth resolution</title><title>Optics express</title><issn>1094-4087</issn><issn>1094-4087</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2008</creationdate><recordtype>article</recordtype><recordid>eNpNj0FKxDAYRoMoOI7uPEAOYOv_J2mSbgQZ6oww0M24LkmaMJXWlqQiM2fzDJ5JZVy4et_bfPAIuUXIkUtxX1c5yhwQmS7PyAKhFJkArc7_7UtyldIrAApVqgV52Plo9j7ORzrFMXT9OPg5HqiZqQSg682RfnTznkJBvz4H2vrpR6JPY_8-d-PbNbkIpk_-5o9L8vJU7VabbFuvn1eP28wxxees9bZFHZhhDg1YYwV61TLrZMuF9bIIpUNtQSFoB9pr5mQZECUHrgIv-JLcnX5dHFOKPjRT7AYTDw1C89ve1FWDsjm1828N9kvu</recordid><startdate>20080721</startdate><enddate>20080721</enddate><creator>Hils, Bernd</creator><creator>Thomson, Mark D.</creator><creator>Löffler, Torsten</creator><creator>Spiegel, Wolff von</creator><creator>Weg, Christian am</creator><creator>Roskos, Hartmut G.</creator><creator>Maagt, Peter de</creator><creator>Doyle, Dominic</creator><creator>Geckeler, Ralf D.</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20080721</creationdate><title>Terahertz profilometry at 600 GHz with 05 μm depth resolution</title><author>Hils, Bernd ; Thomson, Mark D. ; Löffler, Torsten ; Spiegel, Wolff von ; Weg, Christian am ; Roskos, Hartmut G. ; Maagt, Peter de ; Doyle, Dominic ; Geckeler, Ralf D.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c273t-debd18f2a2c1a0bab41e7d2bc6d34be65f9c18b07108c08e82c69f1163037f353</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2008</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Hils, Bernd</creatorcontrib><creatorcontrib>Thomson, Mark D.</creatorcontrib><creatorcontrib>Löffler, Torsten</creatorcontrib><creatorcontrib>Spiegel, Wolff von</creatorcontrib><creatorcontrib>Weg, Christian am</creatorcontrib><creatorcontrib>Roskos, Hartmut G.</creatorcontrib><creatorcontrib>Maagt, Peter de</creatorcontrib><creatorcontrib>Doyle, Dominic</creatorcontrib><creatorcontrib>Geckeler, Ralf D.</creatorcontrib><collection>CrossRef</collection><jtitle>Optics express</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Hils, Bernd</au><au>Thomson, Mark D.</au><au>Löffler, Torsten</au><au>Spiegel, Wolff von</au><au>Weg, Christian am</au><au>Roskos, Hartmut G.</au><au>Maagt, Peter de</au><au>Doyle, Dominic</au><au>Geckeler, Ralf D.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Terahertz profilometry at 600 GHz with 05 μm depth resolution</atitle><jtitle>Optics express</jtitle><date>2008-07-21</date><risdate>2008</risdate><volume>16</volume><issue>15</issue><spage>11289</spage><pages>11289-</pages><issn>1094-4087</issn><eissn>1094-4087</eissn><doi>10.1364/OE.16.011289</doi><oa>free_for_read</oa></addata></record>
fulltext fulltext
identifier ISSN: 1094-4087
ispartof Optics express, 2008-07, Vol.16 (15), p.11289
issn 1094-4087
1094-4087
language eng
recordid cdi_crossref_primary_10_1364_OE_16_011289
source Free E-Journal (出版社公開部分のみ）
title Terahertz profilometry at 600 GHz with 05 μm depth resolution
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-27T05%3A35%3A50IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Terahertz%20profilometry%20at%20600%20GHz%20with%2005%20%CE%BCm%20depth%20resolution&rft.jtitle=Optics%20express&rft.au=Hils,%20Bernd&rft.date=2008-07-21&rft.volume=16&rft.issue=15&rft.spage=11289&rft.pages=11289-&rft.issn=1094-4087&rft.eissn=1094-4087&rft_id=info:doi/10.1364/OE.16.011289&rft_dat=%3Ccrossref%3E10_1364_OE_16_011289%3C/crossref%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c273t-debd18f2a2c1a0bab41e7d2bc6d34be65f9c18b07108c08e82c69f1163037f353%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true