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Local electrical characterization of laser-recorded phase-change marks on amorphous Ge_2Sb_2Te_5 thin films
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Published in: | Optics express 2011-05, Vol.19 (10), p.9492 |
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Main Authors: | , , , , , |
Format: | Article |
Language: | English |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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ISSN: | 1094-4087 1094-4087 |
DOI: | 10.1364/OE.19.009492 |