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Local electrical characterization of laser-recorded phase-change marks on amorphous Ge_2Sb_2Te_5 thin films

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Bibliographic Details
Published in:Optics express 2011-05, Vol.19 (10), p.9492
Main Authors: Chang, Chia Min, Chu, Cheng Hung, Tseng, Ming Lun, Chiang, Hai-Pang, Mansuripur, Masud, Tsai, Din Ping
Format: Article
Language:English
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ISSN:1094-4087
1094-4087
DOI:10.1364/OE.19.009492