Vision ray metrology for freeform optics

Vision ray techniques are known in the optical community to provide low-uncertainty image formation models. In this work, we extend this approach and propose a vision ray metrology system that estimates the geometric wavefront of a measurement sample using the sample-induced deflection in the vision...

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Bibliographic Details
Published in:Optics express 2021-12, Vol.29 (26), p.43480
Main Authors: Ramirez-Andrade, Ana Hiza, Shadalou, Shohreh, Gurganus, Dustin, Davies, Matthew A., Suleski, Thomas J., Falaggis, Konstantinos
Format: Article
Language:English
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Summary:Vision ray techniques are known in the optical community to provide low-uncertainty image formation models. In this work, we extend this approach and propose a vision ray metrology system that estimates the geometric wavefront of a measurement sample using the sample-induced deflection in the vision rays. We show the feasibility of this approach using simulations and measurements of spherical and freeform optics. In contrast to the competitive technique deflectometry, this approach relies on differential measurements and, hence, requires no elaborated calibration procedure that uses sophisticated optimization algorithms to estimate geometric constraints. Applications of this work are the metrology and alignment of freeform optics.
ISSN:1094-4087
1094-4087
DOI:10.1364/OE.443550