Atomic-Scale Analysis of Self-Positioning Nanostructures

We performed an atomic-scale analysis of self-positioning nanostructures using the atomic-scale finite element method (AFEM) and Kriging interpolation technique. Equilibrium atomic configurations are determined for varying structure thicknesses and results are compared with the continuum mechanics s...

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Bibliographic Details
Published in:E-journal of surface science and nanotechnology 2008/12/25, Vol.6, pp.301-306
Main Authors: Nishidate, Y., Nikishkov, G. P.
Format: Article
Language:English
Subjects:
Computer simulations
Gallium arsenide
Indium arsenide
Nano-wires, quantum wires, and nanotubes
Semiconductor-semiconductor heterostructures
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Summary:We performed an atomic-scale analysis of self-positioning nanostructures using the atomic-scale finite element method (AFEM) and Kriging interpolation technique. Equilibrium atomic configurations are determined for varying structure thicknesses and results are compared with the continuum mechanics solution under plane strain conditions. We observed significant decrease of the equilibrium curvature radius when the structure thickness is less than 40 nm. It is found that large compressive strains near the free surface affect the distribution of strains as the structure size decreases. [DOI: 10.1380/ejssnt.2008.301]
ISSN:1348-0391
1348-0391
DOI:10.1380/ejssnt.2008.301