Degradation of electrooptical characteristics of serial GaP light-emitting diodes, caused by fast electrons

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Bibliographic Details
Published in:Semiconductor physics, quantum electronics, and optoelectronics quantum electronics, and optoelectronics, 2015-09, Vol.18 (3), p.312-316
Main Author: Konoreva, O. V.
Format: Article
Language:English
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ISSN:1560-8034
1605-6582
DOI:10.15407/spqeo18.03.312