Measurement of Dynamic Retention with Fast Ejecting System of Targeted Sample (FESTA)

Fast Ejecting System of Targeted sAmple called FESTA has been developed to carry out the measurement of dynamic hydrogen retention by a test sample. A sample can be exposed and extracted from the targeted plasma at any time using FESTA, however, when exposing the sample, the test chamber wall gets c...

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Bibliographic Details
Published in:Plasma and Fusion Research 2020/04/06, Vol.15, pp.2402013-2402013
Main Authors: YUE, Qilin, HANADA, Kazuaki, OYA, Makoto, MATSUO, Shogo, KOJIMA, Shinichiro, IDEI, Hiroshi, ONCHI, Takumi, KURODA, Kengoh, YOSHIDA, Naoaki, IKEZOE, Ryuya, LIU, Yukai, HASEGAWA, Makoto, SHIMABUKURO, Shun, HIGASHIJIMA, Aki, NAGATA, Takahiro, KAWASAKI, Shoji
Format: Article
Language:English
Subjects:
dynamic retention
FESTA
hydrogen recycling
plasma wall interaction
plasma-induced background
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Summary:Fast Ejecting System of Targeted sAmple called FESTA has been developed to carry out the measurement of dynamic hydrogen retention by a test sample. A sample can be exposed and extracted from the targeted plasma at any time using FESTA, however, when exposing the sample, the test chamber wall gets coated by some hydrogen as it is open to the QUEST vacuum vessel. We refer to this as the plasma-induced background. To measure the amount of hydrogen retained by the sample itself, the contribution from the plasma induced background must be subtracted from the measurements. To measure the accurate dynamic retention from plasma-exposed sample, a background subtraction model has been developed and tested. The initial testing shows that the FESTA system and model can estimate the dynamic hydrogen retention by a target test sample.
ISSN:1880-6821
1880-6821
DOI:10.1585/pfr.15.2402013