P-71: Investigation of Optical Films Ripple Phenomenon in TFT-LCD Module by Numerical Computing

Mura is an appearance that indicates low contrast and nonuniform brightness in thin‐film transistor liquid‐ crystal display (TFT‐LCD) devices. It is kinds of optical defects, such as ripple, smear, Newton's rings and moiré, etc. This article primarily discusses ripple of optical films by using...

Full description

Saved in:
Bibliographic Details
Published in:SID International Symposium Digest of technical papers 2007-05, Vol.38 (1), p.457-460
Main Authors: Lin, Mao-Hsing, Chen, Yung-Kan, Kuo, Wu-Cheng, Huang, Kun-Feng
Format: Article
Language:English
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Mura is an appearance that indicates low contrast and nonuniform brightness in thin‐film transistor liquid‐ crystal display (TFT‐LCD) devices. It is kinds of optical defects, such as ripple, smear, Newton's rings and moiré, etc. This article primarily discusses ripple of optical films by using both experimental and numerical model to help understand how ripple occurs and why ripple seen by inspectors. After performing numerical analysis, we discover the root cause that induces ripple and realize why luminance on film‐wrinkled area is varied, finally conclude the parameters that control physical phenomenon.
ISSN:0097-966X
2168-0159
DOI:10.1889/1.2785332