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4.2: International Metrology Standards for Reflective LCDs
This paper summarizes the development of metrology for reflective LCDs from the late 1970s to our days, it introduces the two different approaches used in the LCD industry (directional and multi‐directional illumination) and explains the distinct differences in the results obtained with the two meth...
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Published in: | SID International Symposium Digest of technical papers 2008-05, Vol.39 (1), p.21-23 |
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cites | cdi_FETCH-LOGICAL-c1525-dac95e41b8ad13c5f82b8530a1c38e5ca8b7ed5d9f7e3c56aba0e62c4792f4cc3 |
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container_title | SID International Symposium Digest of technical papers |
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creator | Laur, Juergen |
description | This paper summarizes the development of metrology for reflective LCDs from the late 1970s to our days, it introduces the two different approaches used in the LCD industry (directional and multi‐directional illumination) and explains the distinct differences in the results obtained with the two methods. The current status of the standardization of measuring methods for reflective LCDs by the WG2 of IEC TC110 is presented and an outlook is given of the work to be done before finalization of this standard, especially when the recently initiated horizontal harmonization activity of the IEC TC110 is supposed to be taken into account. |
doi_str_mv | 10.1889/1.3069628 |
format | article |
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title | 4.2: International Metrology Standards for Reflective LCDs |
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