4.4L: LateNews Paper: A Novel High Reliable Integrated Gate Driver with BiScanning Structure using aSi TFT for Large Size FHD TFTLCD TVs

A novel integrated gate driver with biscanning structure using a Si TFT for large size FHD TFTLCD TV has been developed. The proposed gate driver has biscan control circuit which enables reverse scanning operation and TFT stress reduction circuit which enhances gate driver reliability for TV applica...

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Bibliographic Details
Published in:SID International Symposium Digest of technical papers 2010-05, Vol.41 (1), p.35-38
Main Authors: Shin, HongJae, Park, ByungHyun, Son, MiYoung, Kim, ByungHoon, Kim, YongHo, Lee, ChungAh, Youn, WonGyun, Kim, JeomJae, Oh, ChangHo, Kang, InByeong, Hwang, Yong-Kee
Format: Article
Language:English
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Summary:A novel integrated gate driver with biscanning structure using a Si TFT for large size FHD TFTLCD TV has been developed. The proposed gate driver has biscan control circuit which enables reverse scanning operation and TFT stress reduction circuit which enhances gate driver reliability for TV application. Two channel shared node structure also reduce the area of the circuit without performance degradation, while the life time of the integrated gate driver is estimated to 100,000 hours. Thus we successfully developed 47 inch FHD 120Hz TFTLCD panel with this integrated gate driver circuit using aSi TFT.
ISSN:0097-966X
2168-0159
DOI:10.1889/1.3500457