Viscoelastic relaxation measurements in the system SiO 2 -NaAlSiO 4 by photon correlation spectroscopy

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Bibliographic Details
Published in:The American mineralogist 1997-12, Vol.82 (11-12), p.1063-1072
Main Authors: Siewert, Ralf, Rosenhauer, Matthias
Format: Article
Language:English
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Summary:Abstract only
ISSN:0003-004X
DOI:10.2138/am-1997-11-1203