Survey Measurement and Process Quality

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Bibliographic Details
Published in:Technometrics 1998-02, Vol.40 (1), p.83
Main Authors: Ziegel, Eric R., Lyberg, L., Biemer, P., Collins, M., de Leeuw, E., Dippo, C., Schwartz, N., Trewin, D.
Format: Article
Language:English
Online Access:Get full text
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ISSN:0040-1706
DOI:10.2307/1271416