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Fast Scanning Electron Microscopic and Light Microscopic Correlation of Paraffin Sections and Chromosome Spreads of Nickel-Induced Tumor

A carrier which securely accommodates a standard microscope slide, and can be attached to the goniometer stage of a JSM-U3 scanning electron microscope (SEM), and a light microscope (LM) with a precision stage were used in these investigations. This made it possible to transfer a suitably prepared s...

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Bibliographic Details
Published in:Transactions of the American Microscopical Society 1973-04, Vol.92 (2), p.209-217
Main Authors: Geissinger, H. Dieter, Basrur, Parvathi K., Yamashiro, Shigeto
Format: Article
Language:English
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Summary:A carrier which securely accommodates a standard microscope slide, and can be attached to the goniometer stage of a JSM-U3 scanning electron microscope (SEM), and a light microscope (LM) with a precision stage were used in these investigations. This made it possible to transfer a suitably prepared specimen from one microscope to the other. Since both microscope stages are graduated in metric units, predetermined areas of interest could be located under either microscope after taking into account certain correlative integers. The feasibility of this technique was tried out on biopsy sections of human nasopharyngeal tumor. It was noted that the surface characteristics of tumor cells, the basement membrane, and the ciliated regions of the glandular epithelium were better resolved with the SEM. Air-dried preparations of tumor chromosomes examined with the SEM provided a better definition of metaphase chromosomes.
ISSN:0003-0023
DOI:10.2307/3224917