A Single-Event-Transient Hardened Phase Locked Loop for Clock and Data Recovery

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Bibliographic Details
Published in:Chinese Journal of Electronics 2024-03, Vol.33 (2), p.353-361
Main Authors: Yuan, Hengzhou, Liang, Bin, Sang, Hao, Xu, Weixia, Guo, Yang, Chen, Xi
Format: Article
Language:English
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ISSN:1022-4653
2075-5597
DOI:10.23919/cje.2022.00.017