Controlling reflectivity of silver-corundum-silver nanostructure by DC voltage

Significant changes of the permittivity of a silver film have been detected using the surface plasmon resonance (SPR) method when a constant electric field is applied to the 177-nm dielectric corundum film placed between two silver films 49 nm and 36 nm thick. The effect manifests itself as a signif...

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Bibliographic Details
Published in:Optical memory & neural networks 2013, Vol.22 (1), p.1-7
Main Authors: Kryzhanovsky, B. V., Palagushkin, A. N., Prokopenko, S. A., Sergeev, A. P., Melikyan, A. O.
Format: Article
Language:English
Subjects:
Complexity
Computer Science
Information Storage and Retrieval
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Summary:Significant changes of the permittivity of a silver film have been detected using the surface plasmon resonance (SPR) method when a constant electric field is applied to the 177-nm dielectric corundum film placed between two silver films 49 nm and 36 nm thick. The effect manifests itself as a significant change of the reflectivity of the structure when the voltage of up to 30 V is applied to the electrodes. It is shown that the optical parameters of the anode and cathode layers strongly differ if dc voltage is above 4 V.
ISSN:1060-992X
1934-7898
DOI:10.3103/S1060992X13010025