Ferromagnetic resonance, magnetic properties, and resistivity of (CoFeZr)x(Al2O3)1 − x/Si multilayer nanostructures

Comparative investigations of static magnetic properties, magnetoresistance, and ferromagnetic resonance data of multilayer nanostructures consisting of CoFeZr-Al 2 O 3 composite magnetic layers and amorphous silicon semiconductor spacers were performed in a layer thickness range below 5 nm. The inf...

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Bibliographic Details
Published in:Bulletin of the Russian Academy of Sciences. Physics 2010-10, Vol.74 (10), p.1380-1382
Main Authors: Vyzulin, S. A., Gorobinskii, A. V., Kalinin, Yu. E., Lebedeva, E. V., Sitnikov, A. V., Syr’ev, N. E., Trofimenko, I. T., Chekrygina, Yu. I., Shipkova, I. G.
Format: Article
Language:English
Subjects:
Hadrons
Heavy Ions
Nuclear Physics
Physics
Physics and Astronomy
Proceedings of the XXI International Conference “Innovations in Magnetism and Magnetic Materials”
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Summary:Comparative investigations of static magnetic properties, magnetoresistance, and ferromagnetic resonance data of multilayer nanostructures consisting of CoFeZr-Al 2 O 3 composite magnetic layers and amorphous silicon semiconductor spacers were performed in a layer thickness range below 5 nm. The influence of layer dimension parameters and chemical peculiarities of silicon on the inner structure and type of magnetic interactions in nanostructures with 35 and 46 at % magnetic phase composite layers is discussed.
ISSN:1062-8738
1934-9432
DOI:10.3103/S1062873810100151