Magnetic force microscopy study of domain structures in magnetic films

Magnetic force microscopy is used to investigate two different types of samples: thin metal films and ferrite garnet films. It is pointed out for garnet films that magnetic force microscopy allows us only to judge the domain structure of surface layers. Problems associated with conducting measuremen...

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Bibliographic Details
Published in:Bulletin of the Russian Academy of Sciences. Physics 2014, Vol.78 (1), p.49-52
Main Authors: Temiryazev, A. G., Saunin, S. A., Sizov, V. E., Temiryazeva, M. P.
Format: Article
Language:English
Subjects:
Hadrons
Heavy Ions
Nuclear Physics
Physics
Physics and Astronomy
Proceedings of the International Symposium “Nanophysics and Nanoelectronics-2013”
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Summary:Magnetic force microscopy is used to investigate two different types of samples: thin metal films and ferrite garnet films. It is pointed out for garnet films that magnetic force microscopy allows us only to judge the domain structure of surface layers. Problems associated with conducting measurements in external magnetic fields, the effect of the magnetic field of the probe on the investigated domain structure, and using magneto-polarized optics in combination with magnetic force microscopy are considered.
ISSN:1062-8738
1934-9432
DOI:10.3103/S1062873814010183