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Influence of different type irradiation on the parameters of silicon semiconductor devices
Effect of different irradiation (by electrons, neutrons, protons, and gamma) on the main properties of silicon-based semiconductor devices has been studied. A higher emphasis has been placed on transistors as the least radiation-stable structures. It is shown that under irradiation by protons the mo...
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Published in: | Journal of contemporary physics 2008-10, Vol.43 (5), p.226-230 |
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Main Author: | |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | Effect of different irradiation (by electrons, neutrons, protons, and gamma) on the main properties of silicon-based semiconductor devices has been studied. A higher emphasis has been placed on transistors as the least radiation-stable structures. It is shown that under irradiation by protons the modification of corresponding parameters occurs at relatively lower doses. The results are explained on the basis of arising of surface channels of conductivity under irradiation. |
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ISSN: | 1068-3372 1934-9378 |
DOI: | 10.3103/S1068337208050034 |