Specificity of the x-ray structural analysis of the surface layers of metals inhomogeneous in depth

The use of sliding X-ray beams for studying the substructure (the crystallite dispersion and the dislocation density) of surface layers having a considerably inhomogeneous structure in depth is presented. Comparative data on the physical broadenings (β) of the interference lines, which have been def...

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Bibliographic Details
Published in:Surface engineering and applied electrochemistry 2011-12, Vol.47 (6), p.574-577
Main Authors: Mikhailyuk, A. I., Volodina, G. F.
Format: Article
Language:English
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Summary:The use of sliding X-ray beams for studying the substructure (the crystallite dispersion and the dislocation density) of surface layers having a considerably inhomogeneous structure in depth is presented. Comparative data on the physical broadenings (β) of the interference lines, which have been defined by applying sliding X-ray beams and symmetrical measuring (in Bragg-Brentano geometry), of metal surfaces modified through electrospark alloying are presented. The significant difference in the β values is shown. This difference explains the possible inconsistency in the subsequent calculations of the substructural parameters in the case of measurements in another mode.
ISSN:1068-3755
1934-8002
DOI:10.3103/S1068375511060135