Defect Detection Model Using Time Series Data Augmentation and Transformation

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Bibliographic Details
Published in:Computers, materials & continua materials & continua, 2024, Vol.78 (2), p.1713-1730
Main Authors: Kim, Gyu-Il, Yoo, Hyun, Cho, Han-Jin, Chung, Kyungyong
Format: Article
Language:English
Online Access:Get full text
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ISSN:1546-2226
1546-2226
DOI:10.32604/cmc.2023.046324