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Measuring the surface temperature of light-emitting diodes by thermoreflectance
As the latest applications of LEDs require more harsh operating conditions, understanding the device thermal properties becomes more essential for further improving the device efficiencies. In applications where heat dissipation can be a critical issue, thermoreflectance (TR) can be utilized as a us...
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Published in: | Japanese Journal of Applied Physics 2021-05, Vol.60 (5), p.52003 |
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container_title | Japanese Journal of Applied Physics |
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creator | Zheng, Dong-Guang Shin, Dong-Soo Shim, Jong-In |
description | As the latest applications of LEDs require more harsh operating conditions, understanding the device thermal properties becomes more essential for further improving the device efficiencies. In applications where heat dissipation can be a critical issue, thermoreflectance (TR) can be utilized as a useful noncontact measurement technique for analyzing the thermal properties. In this paper, we investigate the TR method of measuring the surface temperature, using a lateral-type blue LED chip under high-power operation. The TR we employ measures the change in reflectivity from the Au metal electrode. By comparing with surface/junction temperatures measured by other methods based on the thermocouple and the forward voltage, we find that the TR method can provide accurate and reliable results of measuring the surface temperature of modern LEDs. A useful insight can also be obtained from the temperature distribution on the LED chip surface. |
doi_str_mv | 10.35848/1347-4065/abf90c |
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fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_crossref_primary_10_35848_1347_4065_abf90c</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2524944295</sourcerecordid><originalsourceid>FETCH-LOGICAL-c344t-f5191b8e4da8141817a7241e256084a0221187dd969ee384058d9505e38d2c143</originalsourceid><addsrcrecordid>eNp1kDtPwzAUhS0EEqXwA9gisbCE2s51Yo-o4iUVdYHZcuObNlHTBNsZ-u9xCIIFpvvQd869OoRcM3qXCQlywTIoUqC5WJhNpWh5QmY_q1Myo5SzFBTn5-TC-yaOuQA2I-tXNH5w9WGbhB0msa1MiUnAtkdnwuAw6apkX293IcW2DmEkbd1Z9MnmOGpc2zms9lgGcyjxkpxVZu_x6rvOyfvjw9vyOV2tn16W96u0zABCWgmm2EYiWCMZMMkKU3BgyEVOJRjKOWOysFblCjGTQIW0SlARe8tLBtmc3Ey-ves-BvRBN93gDvGk5oKDAuBKRIpNVOk67-Obund1a9xRM6q_ctNjSHoMSU-5Rc3tpKm7_te0aUyvc6qFpoJTmuneVhFN_0D_t_4EsDh8Bg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2524944295</pqid></control><display><type>article</type><title>Measuring the surface temperature of light-emitting diodes by thermoreflectance</title><source>IOPscience journals</source><source>Institute of Physics</source><creator>Zheng, Dong-Guang ; Shin, Dong-Soo ; Shim, Jong-In</creator><creatorcontrib>Zheng, Dong-Guang ; Shin, Dong-Soo ; Shim, Jong-In</creatorcontrib><description>As the latest applications of LEDs require more harsh operating conditions, understanding the device thermal properties becomes more essential for further improving the device efficiencies. In applications where heat dissipation can be a critical issue, thermoreflectance (TR) can be utilized as a useful noncontact measurement technique for analyzing the thermal properties. In this paper, we investigate the TR method of measuring the surface temperature, using a lateral-type blue LED chip under high-power operation. The TR we employ measures the change in reflectivity from the Au metal electrode. By comparing with surface/junction temperatures measured by other methods based on the thermocouple and the forward voltage, we find that the TR method can provide accurate and reliable results of measuring the surface temperature of modern LEDs. A useful insight can also be obtained from the temperature distribution on the LED chip surface.</description><identifier>ISSN: 0021-4922</identifier><identifier>EISSN: 1347-4065</identifier><identifier>DOI: 10.35848/1347-4065/abf90c</identifier><identifier>CODEN: JJAPB6</identifier><language>eng</language><publisher>Tokyo: IOP Publishing</publisher><subject>Gold ; Junction temperature ; Light emitting diodes ; Measurement methods ; Measurement techniques ; Surface temperature ; Temperature ; Temperature distribution ; Thermocouples ; Thermodynamic properties ; Thermoreflectance</subject><ispartof>Japanese Journal of Applied Physics, 2021-05, Vol.60 (5), p.52003</ispartof><rights>2021 The Japan Society of Applied Physics</rights><rights>Copyright Japanese Journal of Applied Physics May 2021</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c344t-f5191b8e4da8141817a7241e256084a0221187dd969ee384058d9505e38d2c143</citedby><cites>FETCH-LOGICAL-c344t-f5191b8e4da8141817a7241e256084a0221187dd969ee384058d9505e38d2c143</cites><orcidid>0000-0002-0863-9138 ; 0000-0002-1305-074X ; 0000-0001-8337-788X</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://iopscience.iop.org/article/10.35848/1347-4065/abf90c/pdf$$EPDF$$P50$$Giop$$H</linktopdf><link.rule.ids>314,776,780,27901,27902,38845,53815</link.rule.ids></links><search><creatorcontrib>Zheng, Dong-Guang</creatorcontrib><creatorcontrib>Shin, Dong-Soo</creatorcontrib><creatorcontrib>Shim, Jong-In</creatorcontrib><title>Measuring the surface temperature of light-emitting diodes by thermoreflectance</title><title>Japanese Journal of Applied Physics</title><addtitle>Jpn. J. Appl. Phys</addtitle><description>As the latest applications of LEDs require more harsh operating conditions, understanding the device thermal properties becomes more essential for further improving the device efficiencies. In applications where heat dissipation can be a critical issue, thermoreflectance (TR) can be utilized as a useful noncontact measurement technique for analyzing the thermal properties. In this paper, we investigate the TR method of measuring the surface temperature, using a lateral-type blue LED chip under high-power operation. The TR we employ measures the change in reflectivity from the Au metal electrode. By comparing with surface/junction temperatures measured by other methods based on the thermocouple and the forward voltage, we find that the TR method can provide accurate and reliable results of measuring the surface temperature of modern LEDs. A useful insight can also be obtained from the temperature distribution on the LED chip surface.</description><subject>Gold</subject><subject>Junction temperature</subject><subject>Light emitting diodes</subject><subject>Measurement methods</subject><subject>Measurement techniques</subject><subject>Surface temperature</subject><subject>Temperature</subject><subject>Temperature distribution</subject><subject>Thermocouples</subject><subject>Thermodynamic properties</subject><subject>Thermoreflectance</subject><issn>0021-4922</issn><issn>1347-4065</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2021</creationdate><recordtype>article</recordtype><recordid>eNp1kDtPwzAUhS0EEqXwA9gisbCE2s51Yo-o4iUVdYHZcuObNlHTBNsZ-u9xCIIFpvvQd869OoRcM3qXCQlywTIoUqC5WJhNpWh5QmY_q1Myo5SzFBTn5-TC-yaOuQA2I-tXNH5w9WGbhB0msa1MiUnAtkdnwuAw6apkX293IcW2DmEkbd1Z9MnmOGpc2zms9lgGcyjxkpxVZu_x6rvOyfvjw9vyOV2tn16W96u0zABCWgmm2EYiWCMZMMkKU3BgyEVOJRjKOWOysFblCjGTQIW0SlARe8tLBtmc3Ey-ves-BvRBN93gDvGk5oKDAuBKRIpNVOk67-Obund1a9xRM6q_ctNjSHoMSU-5Rc3tpKm7_te0aUyvc6qFpoJTmuneVhFN_0D_t_4EsDh8Bg</recordid><startdate>20210501</startdate><enddate>20210501</enddate><creator>Zheng, Dong-Guang</creator><creator>Shin, Dong-Soo</creator><creator>Shim, Jong-In</creator><general>IOP Publishing</general><general>Japanese Journal of Applied Physics</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7U5</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0002-0863-9138</orcidid><orcidid>https://orcid.org/0000-0002-1305-074X</orcidid><orcidid>https://orcid.org/0000-0001-8337-788X</orcidid></search><sort><creationdate>20210501</creationdate><title>Measuring the surface temperature of light-emitting diodes by thermoreflectance</title><author>Zheng, Dong-Guang ; Shin, Dong-Soo ; Shim, Jong-In</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c344t-f5191b8e4da8141817a7241e256084a0221187dd969ee384058d9505e38d2c143</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2021</creationdate><topic>Gold</topic><topic>Junction temperature</topic><topic>Light emitting diodes</topic><topic>Measurement methods</topic><topic>Measurement techniques</topic><topic>Surface temperature</topic><topic>Temperature</topic><topic>Temperature distribution</topic><topic>Thermocouples</topic><topic>Thermodynamic properties</topic><topic>Thermoreflectance</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Zheng, Dong-Guang</creatorcontrib><creatorcontrib>Shin, Dong-Soo</creatorcontrib><creatorcontrib>Shim, Jong-In</creatorcontrib><collection>CrossRef</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Japanese Journal of Applied Physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Zheng, Dong-Guang</au><au>Shin, Dong-Soo</au><au>Shim, Jong-In</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Measuring the surface temperature of light-emitting diodes by thermoreflectance</atitle><jtitle>Japanese Journal of Applied Physics</jtitle><addtitle>Jpn. J. Appl. Phys</addtitle><date>2021-05-01</date><risdate>2021</risdate><volume>60</volume><issue>5</issue><spage>52003</spage><pages>52003-</pages><issn>0021-4922</issn><eissn>1347-4065</eissn><coden>JJAPB6</coden><abstract>As the latest applications of LEDs require more harsh operating conditions, understanding the device thermal properties becomes more essential for further improving the device efficiencies. In applications where heat dissipation can be a critical issue, thermoreflectance (TR) can be utilized as a useful noncontact measurement technique for analyzing the thermal properties. In this paper, we investigate the TR method of measuring the surface temperature, using a lateral-type blue LED chip under high-power operation. The TR we employ measures the change in reflectivity from the Au metal electrode. By comparing with surface/junction temperatures measured by other methods based on the thermocouple and the forward voltage, we find that the TR method can provide accurate and reliable results of measuring the surface temperature of modern LEDs. A useful insight can also be obtained from the temperature distribution on the LED chip surface.</abstract><cop>Tokyo</cop><pub>IOP Publishing</pub><doi>10.35848/1347-4065/abf90c</doi><tpages>7</tpages><orcidid>https://orcid.org/0000-0002-0863-9138</orcidid><orcidid>https://orcid.org/0000-0002-1305-074X</orcidid><orcidid>https://orcid.org/0000-0001-8337-788X</orcidid></addata></record> |
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source | IOPscience journals; Institute of Physics |
subjects | Gold Junction temperature Light emitting diodes Measurement methods Measurement techniques Surface temperature Temperature Temperature distribution Thermocouples Thermodynamic properties Thermoreflectance |
title | Measuring the surface temperature of light-emitting diodes by thermoreflectance |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-21T23%3A41%3A19IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Measuring%20the%20surface%20temperature%20of%20light-emitting%20diodes%20by%20thermoreflectance&rft.jtitle=Japanese%20Journal%20of%20Applied%20Physics&rft.au=Zheng,%20Dong-Guang&rft.date=2021-05-01&rft.volume=60&rft.issue=5&rft.spage=52003&rft.pages=52003-&rft.issn=0021-4922&rft.eissn=1347-4065&rft.coden=JJAPB6&rft_id=info:doi/10.35848/1347-4065/abf90c&rft_dat=%3Cproquest_cross%3E2524944295%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c344t-f5191b8e4da8141817a7241e256084a0221187dd969ee384058d9505e38d2c143%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=2524944295&rft_id=info:pmid/&rfr_iscdi=true |