Realizing reliable linearity and forming-free property in conductive bridging random access memory synapse by alloy electrode engineering

• Published in: Applied physics express 2024-03, Vol.17 (3), p.36505
• Main Authors: Chen, Ao, Zhang, Puyi, Zheng, Yiwei, Yuan, Xiaoxu, Ma, Guokun, Rao, Yiheng, Wan, Houzhao, Liu, Nengfan, Chen, Qin, Yang, Daohong, Wang, Hao
• Format: Article
• Language: English
• Subjects: alloy electrode; artificial synapse; conductive filament; linearity; synaptic behaviors
• ISSN: 1882-0778; 1882-0786
• DOI: 10.35848/1882-0786/ad2f65

The linearity of conductance modulation of the artificial synapse severely restricts the recognition accuracy and the convergence rate in the learning of artificial neural networks. In this work, by alloy electrode engineering, a Ti–Ag device gained the forming-free property because Ag ions were promoted to migrate into the GeTeO x layer to form a thicker conductive filament. This facilitated a uniform change in conductance with the pulse number, and the alloy synapse achieved a significant improvement in linearity (350%), which demonstrated its enhancement in recognition accuracy. To further validate its potential as a comprehensive artificial synapse, the multi-essential synaptic behaviors, including spike-timing-dependent plasticity, spike-rate-dependent plasticity, paired-pulse facilitation, post-tetanic potentiation, and excitatory post-synaptic current, were achieved successfully. This work proposes a promising approach to enhance the performance of conductive bridging random access memory synaptic devices, which benefits the hardware implementation of neuromorphic systems.