Probing buried interface band dispersion of a MgO/Fe heterostructure with hard X-ray angle-resolved photoemission

Interface band dispersion of a MgO(2 nm)/Fe(50 nm) heterostructure was detected by hard X-ray angle-resolved photoemission spectroscopy (HARPES) with the excitation photon energy of 3.29 keV by utilizing X-ray total reflection (TR). By subtracting bulk-sensitive band dispersion of the buried Fe(001)...

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Bibliographic Details
Published in:Applied physics express 2024-07, Vol.17 (7), p.75501
Main Authors: Ueda, Shigenori, Mizuguchi, Masaki
Format: Article
Language:English
Subjects:
band dispersion
buried interface
hard X-ray angle-resolved photoelectron spectroscopy
MgO/Fe heterostructure
X-ray total reflection
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Summary:Interface band dispersion of a MgO(2 nm)/Fe(50 nm) heterostructure was detected by hard X-ray angle-resolved photoemission spectroscopy (HARPES) with the excitation photon energy of 3.29 keV by utilizing X-ray total reflection (TR). By subtracting bulk-sensitive band dispersion of the buried Fe(001) obtained by HARPES in the non-TR condition from near-interface-sensitive Fe(001) band dispersion obtained by TR-HARPES, the band-folding of Fe and the O 2 p -Fe 3 d hybridization at the heterointerface were clearly unveiled. These results suggest that HARPES can probe not only the bulk band but also the buried interface band of heterojunctions.
ISSN:1882-0778
1882-0786
DOI:10.35848/1882-0786/ad5e33