A review of the dual-wavelength technique for phase imaging and 3D topography

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Bibliographic Details
Published in:Light: advanced manufacturing 2022, Vol.3 (2), p.1
Main Authors: Zhou, Haowen, Hussain, Mallik M. R., Banerjee, Partha P.
Format: Article
Language:English
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ISSN:2831-4093
DOI:10.37188/lam.2022.017