Performance and Analysis of Ultra Deep Sub Micron Technology Using Complementary Metal Oxide Semiconductor Inverter

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Bibliographic Details
Published in:International journal of VLSI design & communication systems 2014-12, Vol.5 (6), p.75-80
Main Authors: Goswami, Shikha, Akashe, Shyam
Format: Article
Language:English
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ISSN:0976-1527
0976-1357
DOI:10.5121/vlsic.2014.5608