Single-shot, high sensitivity X-ray phase contrast imaging system based on a Hartmann mask

• Published in: E-journal of Nondestructive Testing 2020-02, Vol.25 (2)
• Main Authors: De La Rochefoucauld, Ombeline, Begani Provinciali, Ginevra, Cedola, Alessia, Idir, Mourad, Dovillaire, Guillaume, Harms, Fabrice, Legrand, Jérôme, Levecq, Xavier, Mastropietro, Francesca, Nicolas, Lionel, Oudjedi, Laura, Piponnier, Martin, Zeitoun, Philippe
• Format: Article
• Language: English
• ISSN: 1435-4934; 1435-4934
• DOI: 10.58286/25104

Significant efforts are currently ongoing in X-Ray imaging to provide multimodal imaging systems, targeting better sensitivity and specificity for both biomedical or non-destructive testing (NDT) applications. X-Ray Phase Contrast Imaging (X-PCI) shows great capability to differentiate elements with similar absorption. For example, in the medical field, knowing the chemical composition of breast microcalcifications would help to differentiate malign and benign tumors. The composition can be determined from the measurement of the phase as the optical index of materials is directly related to the composition. We propose a novel, high-sensitivity X-ray quantitative phase imaging system based on a Hartmann wavefront sensor. The system provides high resolution (20?m without magnification) and high sensitivity (~100 nrad), and is compatible with tomographic experiments using both synchrotron beamlines or laboratory sources. We present here our first X-PCI prototype as well as the first images obtained. We also present an alternative design based on the same approach, providing larger field-of-view at the cost of some trade-off regarding resolution and sensitivity and the first tomographic results obtained with this imaging system.