Corrigendum: “Local structure of Yb 3+ ions and X-ray induced defect in Yb-doped silica glass” [Jpn. J. Appl. Phys. 58 012003 (2019)]

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Bibliographic Details
Published in:Japanese Journal of Applied Physics 2019-02, Vol.58 (2), p.29301
Main Authors: Okazaki, T., Sekiya, E. H., Saito, K.
Format: Article
Language:English
Online Access:Get full text
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ISSN:0021-4922
1347-4065
DOI:10.7567/1347-4065/aafc53