Combined Chemical Microanalysis Using SAM and X-PEEM

Both, PEEM (Photoemission Microscopy) and SAM (Scanning Auger Microprobe) are surface sensitive techniques providing spatially resolved chemical analysis. We compare these techniques and present results on thin High Temperature Superconductor films. The X-PEEM makes use of tuneable monochromatised s...

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Bibliographic Details
Published in:Japanese Journal of Applied Physics 1999-01, Vol.38 (S1), p.317
Main Authors: Grahneis, Werner, Ziethen, Chistian, Fecher, Gerhard H., Schönhense, Gerd
Format: Article
Language:English
Online Access:Get full text
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Summary:Both, PEEM (Photoemission Microscopy) and SAM (Scanning Auger Microprobe) are surface sensitive techniques providing spatially resolved chemical analysis. We compare these techniques and present results on thin High Temperature Superconductor films. The X-PEEM makes use of tuneable monochromatised soft X-rays from a synchrotron radiation source to excite electrons from core levels. A higher secondary electron yield is observed when tuning the source above one of the characteristic absorption edges. These true secondaries are detected with the electron microscope in parallel imaging mode. Therefore, PEEM gives besides the imaging additional information on the chemical bonding and its local order making use of NEXAFS and EXAFS spectroscopies.
ISSN:0021-4922
1347-4065
DOI:10.7567/JJAPS.38S1.317