ON-State Reliability of Solid-Electrolyte Switch under Pulsed Alternating Current Stress for Programmable Logic Device

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Published in:Japanese Journal of Applied Physics 2011-07, Vol.50 (7R), p.74201
Main Authors: Banno, Naoki, Sakamoto, Toshitsugu, Tada, Munehiro, Miyamura, Makoto, Okamoto, Koichiro, Hada, Hiromitsu, Aono, Masakazu
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Language:eng ; jpn
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container_title Japanese Journal of Applied Physics
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creator Banno, Naoki
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doi_str_mv 10.7567/JJAP.50.074201
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source Institute of Physics IOPscience extra; Institute of Physics:Jisc Collections:IOP Publishing Read and Publish 2024-2025 (Reading List)
title ON-State Reliability of Solid-Electrolyte Switch under Pulsed Alternating Current Stress for Programmable Logic Device
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