Electrical Characteristic Analysis of Postannealed ZnO Thin-Film Transistors under O 2 Ambient

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Bibliographic Details
Published in:Japanese Journal of Applied Physics 2012-09, Vol.51 (9S2), p.9
Main Authors: Jeong, Kwang-Seok, Kim, Yu-Mi, Yun, Ho-Jin, Yang, Seung-Dong, Lee, Sang-Youl, Kim, Young-Su, Lee, Hi-Deok, Lee, Ga-Won
Format: Article
Language:English
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ISSN:0021-4922
1347-4065
DOI:10.7567/JJAP.51.09MF09