Spectral analysis of the angular distribution function of back reflectors for thin film silicon solar cells

• Published in: Journal of non-crystalline solids 2006-06, Vol.352 (9-20), p.1896-1899
• Main Authors: Escarré, J., Villar, F., Asensi, J.M., Bertomeu, J., Andreu, J.
• Format: Article
• Language: English
• Subjects: Absorció; Absorption; Applied sciences; Cèl·lules solars; Energia solar; Energy; Espectroscòpia; Exact sciences and technology; Fotons; Modeling and simulation; Natural energy; Optical properties; Optics; Pel·lícules fines; Photons; Photovoltaic conversion; Solar cells; Solar cells. Photoelectrochemical cells; Solar energy; Spectrum analysis; Thin films; Òptica
• ISSN: 0022-3093; 1873-4812
• DOI: 10.1016/j.jnoncrysol.2005.12.046

Nowadays, one of the most important challenges to enhance the efficiency of thin film silicon solar cells is to increase the short circuit intensity by means of optical confinement methods, such as textured back-reflector structures. In this work, two possible textured structures to be used as back reflectors for n–i–p solar cells have been optically analyzed and compared to a smooth one by using a system which is able to measure the angular distribution function (ADF) of the scattered light in a wide spectral range (350–1000nm). The accurate analysis of the ADF data corresponding to the reflector structures and to the μc-Si:H films deposited onto them allows the optical losses due to the reflector absorption and its effectiveness in increasing light absorption in the μc-Si:H layer, mainly at long wavelengths, to be quantified.