Loading…

Spectral analysis of the angular distribution function of back reflectors for thin film silicon solar cells

Nowadays, one of the most important challenges to enhance the efficiency of thin film silicon solar cells is to increase the short circuit intensity by means of optical confinement methods, such as textured back-reflector structures. In this work, two possible textured structures to be used as back...

Full description

Saved in:

Bibliographic Details
Published in:	Journal of non-crystalline solids 2006-06, Vol.352 (9-20), p.1896-1899
Main Authors:	Escarré, J., Villar, F., Asensi, J.M., Bertomeu, J., Andreu, J.
Format:	Article
Language:	English
Subjects:	Absorció Absorption Applied sciences Cèl·lules solars Energia solar Energy Espectroscòpia Exact sciences and technology Fotons Modeling and simulation Natural energy Optical properties Optics Pel·lícules fines Photons Photovoltaic conversion Solar cells Solar cells. Photoelectrochemical cells Solar energy Spectrum analysis Thin films Òptica
Citations:	Items that this one cites Items that cite this one
Online Access:	Get full text
Tags:	Add Tag No Tags, Be the first to tag this record!

cited_by	cdi_FETCH-LOGICAL-c440t-3493b63185494599d6d3625ded7ae1856185892641c163e9e3e6716a44a873da3
cites	cdi_FETCH-LOGICAL-c440t-3493b63185494599d6d3625ded7ae1856185892641c163e9e3e6716a44a873da3
container_end_page	1899
container_issue	9-20
container_start_page	1896
container_title	Journal of non-crystalline solids
container_volume	352
creator	Escarré, J. Villar, F. Asensi, J.M. Bertomeu, J. Andreu, J.
description	Nowadays, one of the most important challenges to enhance the efficiency of thin film silicon solar cells is to increase the short circuit intensity by means of optical confinement methods, such as textured back-reflector structures. In this work, two possible textured structures to be used as back reflectors for n–i–p solar cells have been optically analyzed and compared to a smooth one by using a system which is able to measure the angular distribution function (ADF) of the scattered light in a wide spectral range (350–1000nm). The accurate analysis of the ADF data corresponding to the reflector structures and to the μc-Si:H films deposited onto them allows the optical losses due to the reflector absorption and its effectiveness in increasing light absorption in the μc-Si:H layer, mainly at long wavelengths, to be quantified.
doi_str_mv	10.1016/j.jnoncrysol.2005.12.046
format	article
fullrecord	<record><control><sourceid>csuc_cross</sourceid><recordid>TN_cdi_csuc_recercat_oai_recercat_cat_2072_219305</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0022309306002389</els_id><sourcerecordid>oai_recercat_cat_2072_219305</sourcerecordid><originalsourceid>FETCH-LOGICAL-c440t-3493b63185494599d6d3625ded7ae1856185892641c163e9e3e6716a44a873da3</originalsourceid><addsrcrecordid>eNqFUMtOwzAQtBBIlMI_-MIxwa848REqXlIlDsDZch0HnLpxZSdI_Xu2tFKPWFp515oZ7wxCmJKSEirv-rIf4mDTLsdQMkKqkrKSCHmGZrSpeSEays7RjBDGCk4Uv0RXOfcETs2bGVq_b50dkwnYDCbsss84dnj8djB_TcEk3Po8Jr-aRh8H3E2D_WsAtDJ2jZPrAgjElHEXExA9gHzY4OyDtwCEtUDEuhDyNbroTMju5njP0efT48fipVi-Pb8u7peFFYKMBReKrySnTSWUqJRqZcslq1rX1sbBq4RqFJOCWiq5U447WVNphDBguDV8juhB1-bJ6uSsS9aMOhp_GvbFSM00o4qTCjjNkZNizuBKb5PfmLTTlOh90LrXp6D1PmhNmYaggXp7oG5NtiZ0yQzW5xO_VkQ0sgbcwwHnwPuPd0ln691gXethrVG30f__2S-Yt5pJ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Spectral analysis of the angular distribution function of back reflectors for thin film silicon solar cells</title><source>ScienceDirect Freedom Collection 2022-2024</source><creator>Escarré, J. ; Villar, F. ; Asensi, J.M. ; Bertomeu, J. ; Andreu, J.</creator><creatorcontrib>Escarré, J. ; Villar, F. ; Asensi, J.M. ; Bertomeu, J. ; Andreu, J.</creatorcontrib><description>Nowadays, one of the most important challenges to enhance the efficiency of thin film silicon solar cells is to increase the short circuit intensity by means of optical confinement methods, such as textured back-reflector structures. In this work, two possible textured structures to be used as back reflectors for n–i–p solar cells have been optically analyzed and compared to a smooth one by using a system which is able to measure the angular distribution function (ADF) of the scattered light in a wide spectral range (350–1000nm). The accurate analysis of the ADF data corresponding to the reflector structures and to the μc-Si:H films deposited onto them allows the optical losses due to the reflector absorption and its effectiveness in increasing light absorption in the μc-Si:H layer, mainly at long wavelengths, to be quantified.</description><identifier>ISSN: 0022-3093</identifier><identifier>EISSN: 1873-4812</identifier><identifier>DOI: 10.1016/j.jnoncrysol.2005.12.046</identifier><identifier>CODEN: JNCSBJ</identifier><language>eng</language><publisher>Amsterdam: Elsevier B.V</publisher><subject>Absorció ; Absorption ; Applied sciences ; Cèl·lules solars ; Energia solar ; Energy ; Espectroscòpia ; Exact sciences and technology ; Fotons ; Modeling and simulation ; Natural energy ; Optical properties ; Optics ; Pel·lícules fines ; Photons ; Photovoltaic conversion ; Solar cells ; Solar cells. Photoelectrochemical cells ; Solar energy ; Spectrum analysis ; Thin films ; Òptica</subject><ispartof>Journal of non-crystalline solids, 2006-06, Vol.352 (9-20), p.1896-1899</ispartof><rights>2006 Elsevier B.V.</rights><rights>2006 INIST-CNRS</rights><rights>(c) Elsevier B.V., 2006 info:eu-repo/semantics/openAccess</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c440t-3493b63185494599d6d3625ded7ae1856185892641c163e9e3e6716a44a873da3</citedby><cites>FETCH-LOGICAL-c440t-3493b63185494599d6d3625ded7ae1856185892641c163e9e3e6716a44a873da3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,309,310,314,780,784,789,790,885,23930,23931,25140,27924,27925</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=17904867$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Escarré, J.</creatorcontrib><creatorcontrib>Villar, F.</creatorcontrib><creatorcontrib>Asensi, J.M.</creatorcontrib><creatorcontrib>Bertomeu, J.</creatorcontrib><creatorcontrib>Andreu, J.</creatorcontrib><title>Spectral analysis of the angular distribution function of back reflectors for thin film silicon solar cells</title><title>Journal of non-crystalline solids</title><description>Nowadays, one of the most important challenges to enhance the efficiency of thin film silicon solar cells is to increase the short circuit intensity by means of optical confinement methods, such as textured back-reflector structures. In this work, two possible textured structures to be used as back reflectors for n–i–p solar cells have been optically analyzed and compared to a smooth one by using a system which is able to measure the angular distribution function (ADF) of the scattered light in a wide spectral range (350–1000nm). The accurate analysis of the ADF data corresponding to the reflector structures and to the μc-Si:H films deposited onto them allows the optical losses due to the reflector absorption and its effectiveness in increasing light absorption in the μc-Si:H layer, mainly at long wavelengths, to be quantified.</description><subject>Absorció</subject><subject>Absorption</subject><subject>Applied sciences</subject><subject>Cèl·lules solars</subject><subject>Energia solar</subject><subject>Energy</subject><subject>Espectroscòpia</subject><subject>Exact sciences and technology</subject><subject>Fotons</subject><subject>Modeling and simulation</subject><subject>Natural energy</subject><subject>Optical properties</subject><subject>Optics</subject><subject>Pel·lícules fines</subject><subject>Photons</subject><subject>Photovoltaic conversion</subject><subject>Solar cells</subject><subject>Solar cells. Photoelectrochemical cells</subject><subject>Solar energy</subject><subject>Spectrum analysis</subject><subject>Thin films</subject><subject>Òptica</subject><issn>0022-3093</issn><issn>1873-4812</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2006</creationdate><recordtype>article</recordtype><recordid>eNqFUMtOwzAQtBBIlMI_-MIxwa848REqXlIlDsDZch0HnLpxZSdI_Xu2tFKPWFp515oZ7wxCmJKSEirv-rIf4mDTLsdQMkKqkrKSCHmGZrSpeSEays7RjBDGCk4Uv0RXOfcETs2bGVq_b50dkwnYDCbsss84dnj8djB_TcEk3Po8Jr-aRh8H3E2D_WsAtDJ2jZPrAgjElHEXExA9gHzY4OyDtwCEtUDEuhDyNbroTMju5njP0efT48fipVi-Pb8u7peFFYKMBReKrySnTSWUqJRqZcslq1rX1sbBq4RqFJOCWiq5U447WVNphDBguDV8juhB1-bJ6uSsS9aMOhp_GvbFSM00o4qTCjjNkZNizuBKb5PfmLTTlOh90LrXp6D1PmhNmYaggXp7oG5NtiZ0yQzW5xO_VkQ0sgbcwwHnwPuPd0ln691gXethrVG30f__2S-Yt5pJ</recordid><startdate>20060615</startdate><enddate>20060615</enddate><creator>Escarré, J.</creator><creator>Villar, F.</creator><creator>Asensi, J.M.</creator><creator>Bertomeu, J.</creator><creator>Andreu, J.</creator><general>Elsevier B.V</general><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>XX2</scope></search><sort><creationdate>20060615</creationdate><title>Spectral analysis of the angular distribution function of back reflectors for thin film silicon solar cells</title><author>Escarré, J. ; Villar, F. ; Asensi, J.M. ; Bertomeu, J. ; Andreu, J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c440t-3493b63185494599d6d3625ded7ae1856185892641c163e9e3e6716a44a873da3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2006</creationdate><topic>Absorció</topic><topic>Absorption</topic><topic>Applied sciences</topic><topic>Cèl·lules solars</topic><topic>Energia solar</topic><topic>Energy</topic><topic>Espectroscòpia</topic><topic>Exact sciences and technology</topic><topic>Fotons</topic><topic>Modeling and simulation</topic><topic>Natural energy</topic><topic>Optical properties</topic><topic>Optics</topic><topic>Pel·lícules fines</topic><topic>Photons</topic><topic>Photovoltaic conversion</topic><topic>Solar cells</topic><topic>Solar cells. Photoelectrochemical cells</topic><topic>Solar energy</topic><topic>Spectrum analysis</topic><topic>Thin films</topic><topic>Òptica</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Escarré, J.</creatorcontrib><creatorcontrib>Villar, F.</creatorcontrib><creatorcontrib>Asensi, J.M.</creatorcontrib><creatorcontrib>Bertomeu, J.</creatorcontrib><creatorcontrib>Andreu, J.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Recercat</collection><jtitle>Journal of non-crystalline solids</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Escarré, J.</au><au>Villar, F.</au><au>Asensi, J.M.</au><au>Bertomeu, J.</au><au>Andreu, J.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Spectral analysis of the angular distribution function of back reflectors for thin film silicon solar cells</atitle><jtitle>Journal of non-crystalline solids</jtitle><date>2006-06-15</date><risdate>2006</risdate><volume>352</volume><issue>9-20</issue><spage>1896</spage><epage>1899</epage><pages>1896-1899</pages><issn>0022-3093</issn><eissn>1873-4812</eissn><coden>JNCSBJ</coden><abstract>Nowadays, one of the most important challenges to enhance the efficiency of thin film silicon solar cells is to increase the short circuit intensity by means of optical confinement methods, such as textured back-reflector structures. In this work, two possible textured structures to be used as back reflectors for n–i–p solar cells have been optically analyzed and compared to a smooth one by using a system which is able to measure the angular distribution function (ADF) of the scattered light in a wide spectral range (350–1000nm). The accurate analysis of the ADF data corresponding to the reflector structures and to the μc-Si:H films deposited onto them allows the optical losses due to the reflector absorption and its effectiveness in increasing light absorption in the μc-Si:H layer, mainly at long wavelengths, to be quantified.</abstract><cop>Amsterdam</cop><pub>Elsevier B.V</pub><doi>10.1016/j.jnoncrysol.2005.12.046</doi><tpages>4</tpages><oa>free_for_read</oa></addata></record>
fulltext	fulltext
identifier	ISSN: 0022-3093
ispartof	Journal of non-crystalline solids, 2006-06, Vol.352 (9-20), p.1896-1899
issn	0022-3093 1873-4812
language	eng
recordid	cdi_csuc_recercat_oai_recercat_cat_2072_219305
source	ScienceDirect Freedom Collection 2022-2024
subjects	Absorció Absorption Applied sciences Cèl·lules solars Energia solar Energy Espectroscòpia Exact sciences and technology Fotons Modeling and simulation Natural energy Optical properties Optics Pel·lícules fines Photons Photovoltaic conversion Solar cells Solar cells. Photoelectrochemical cells Solar energy Spectrum analysis Thin films Òptica
title	Spectral analysis of the angular distribution function of back reflectors for thin film silicon solar cells
url	http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-04T13%3A33%3A34IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-csuc_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Spectral%20analysis%20of%20the%20angular%20distribution%20function%20of%20back%20reflectors%20for%20thin%20film%20silicon%20solar%20cells&rft.jtitle=Journal%20of%20non-crystalline%20solids&rft.au=Escarr%C3%A9,%20J.&rft.date=2006-06-15&rft.volume=352&rft.issue=9-20&rft.spage=1896&rft.epage=1899&rft.pages=1896-1899&rft.issn=0022-3093&rft.eissn=1873-4812&rft.coden=JNCSBJ&rft_id=info:doi/10.1016/j.jnoncrysol.2005.12.046&rft_dat=%3Ccsuc_cross%3Eoai_recercat_cat_2072_219305%3C/csuc_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c440t-3493b63185494599d6d3625ded7ae1856185892641c163e9e3e6716a44a873da3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true