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Photodiodes based on fullerene semiconductor

Fullerene thin films have been deposited by thermal evaporation on glass substrates at room temperature. A comprehensive optical characterization was performed, including low-level optical absorption measured by photothermal deflection spectroscopy. The optical absorption spectrum reveals a direct b...

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Bibliographic Details
Published in:Thin solid films 2007-07, Vol.515 (19), p.7675-7678
Main Authors: Voz, C., Puigdollers, J., Cheylan, S., Fonrodona, M., Stella, M., Andreu, J., Alcubilla, R.
Format: Article
Language:English
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Summary:Fullerene thin films have been deposited by thermal evaporation on glass substrates at room temperature. A comprehensive optical characterization was performed, including low-level optical absorption measured by photothermal deflection spectroscopy. The optical absorption spectrum reveals a direct bandgap of 2.3 eV and absorption bands at 2.8 and 3.6 eV, which are related to the creation of charge-transfer excitons. Various photodiodes on indium–tin-oxide coated glass substrates were also fabricated, using different metallic contacts in order to compare their respective electrical characteristics. The influence of a poly(3,4-ethylenedioxythiophene) poly(styrenesulfonate) buffer layer between the indium–tin-oxide electrode and the fullerene semiconductor is also demonstrated. These results are discussed in terms of the workfunction for each electrode. Finally, the behaviour of the external quantum efficiency is analyzed for the whole wavelength spectrum.
ISSN:0040-6090
1879-2731
DOI:10.1016/j.tsf.2006.11.160