Spectroscopic ellipsometry study of Cu2ZnSnSe4 bulk crystals

Using spectroscopic ellipsometry we investigated and analyzed the pseudo-optical constants of Cu2ZnSnSe4 bulk crystals, grown by the Bridgman method, over 0.8–4.5 eV photon energy range. The structures found in the spectra of the complex pseudodielectric functions were associated to E0, E1A, and E1B...

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Bibliographic Details
Published in:Applied physics letters 2014-08, Vol.105 (6)
Main Authors: León, M., Levcenko, S., Serna, R., Bodnar, I. V., Nateprov, A., Guc, M., Gurieva, G., Lopez, N., Merino, J. M., Caballero, R., Schorr, S., Perez-Rodriguez, A., Arushanov, E.
Format: Article
Language:English
Subjects:
Absorptivity
Applied physics
Bridgman method
Computer simulation
Copper zinc tin selenide
Cristal·lografia
Crystal growth
Crystallography
Ellipsometry
El·lipsometria
Refractivity
Simulated annealing
Spectroellipsometry
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Summary:Using spectroscopic ellipsometry we investigated and analyzed the pseudo-optical constants of Cu2ZnSnSe4 bulk crystals, grown by the Bridgman method, over 0.8–4.5 eV photon energy range. The structures found in the spectra of the complex pseudodielectric functions were associated to E0, E1A, and E1B interband transitions and were analyzed in frame of the Adachi's model. The interband transition parameters such as strength, threshold energy, and broadening were evaluated by using the simulated annealing algorithm. In addition, the pseudo-complex refractive index, extinction coefficient, absorption coefficient, and normal-incidence reflectivity were derived over 0.8–4.5 eV photon energy range.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.4892548