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Spectroscopic ellipsometry study of Cu2ZnSnSe4 bulk crystals

Using spectroscopic ellipsometry we investigated and analyzed the pseudo-optical constants of Cu2ZnSnSe4 bulk crystals, grown by the Bridgman method, over 0.8–4.5 eV photon energy range. The structures found in the spectra of the complex pseudodielectric functions were associated to E0, E1A, and E1B...

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Published in:	Applied physics letters 2014-08, Vol.105 (6)
Main Authors:	León, M., Levcenko, S., Serna, R., Bodnar, I. V., Nateprov, A., Guc, M., Gurieva, G., Lopez, N., Merino, J. M., Caballero, R., Schorr, S., Perez-Rodriguez, A., Arushanov, E.
Format:	Article
Language:	English
Subjects:	Absorptivity Applied physics Bridgman method Computer simulation Copper zinc tin selenide Cristal·lografia Crystal growth Crystallography Ellipsometry El·lipsometria Refractivity Simulated annealing Spectroellipsometry
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cited_by	cdi_FETCH-LOGICAL-c334t-22be5b8880d6cbd80cfd936ba85b1de705b2e5097474517017a48eb9ebf27c243
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creator	León, M. Levcenko, S. Serna, R. Bodnar, I. V. Nateprov, A. Guc, M. Gurieva, G. Lopez, N. Merino, J. M. Caballero, R. Schorr, S. Perez-Rodriguez, A. Arushanov, E.
description	Using spectroscopic ellipsometry we investigated and analyzed the pseudo-optical constants of Cu2ZnSnSe4 bulk crystals, grown by the Bridgman method, over 0.8–4.5 eV photon energy range. The structures found in the spectra of the complex pseudodielectric functions were associated to E0, E1A, and E1B interband transitions and were analyzed in frame of the Adachi's model. The interband transition parameters such as strength, threshold energy, and broadening were evaluated by using the simulated annealing algorithm. In addition, the pseudo-complex refractive index, extinction coefficient, absorption coefficient, and normal-incidence reflectivity were derived over 0.8–4.5 eV photon energy range.
doi_str_mv	10.1063/1.4892548
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source	American Institute of Physics (AIP) Publications; American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list)
subjects	Absorptivity Applied physics Bridgman method Computer simulation Copper zinc tin selenide Cristal·lografia Crystal growth Crystallography Ellipsometry El·lipsometria Refractivity Simulated annealing Spectroellipsometry
title	Spectroscopic ellipsometry study of Cu2ZnSnSe4 bulk crystals
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