Piezoresponse force microscopy and nanoferroic phenomena

Since its inception more than 25 years ago, Piezoresponse Force Microscopy (PFM) has become one of the mainstream techniques in the field of nanoferroic materials. This review describes the evolution of PFM from an imaging technique to a set of advanced methods, which have played a critical role in...

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Bibliographic Details
Published in:Nature communications 2019-04, Vol.10 (1), p.1661-1661, Article 1661
Main Authors: Gruverman, Alexei, Alexe, Marin, Meier, Dennis
Format: Article
Language:English
Subjects:
147/136
639/301/119/996
639/925/357/995
639/925/930/2735
Domain walls
Humanities and Social Sciences
Microscopy
multidisciplinary
Nanoelectronics
Review
Review Article
Science
Science (multidisciplinary)
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Summary:Since its inception more than 25 years ago, Piezoresponse Force Microscopy (PFM) has become one of the mainstream techniques in the field of nanoferroic materials. This review describes the evolution of PFM from an imaging technique to a set of advanced methods, which have played a critical role in launching new areas of ferroic research, such as multiferroic devices and domain wall nanoelectronics. The paper reviews the impact of advanced PFM modes concerning the discovery and scientific understanding of novel nanoferroic phenomena and discusses challenges associated with the correct interpretation of PFM data. In conclusion, it offers an outlook for future trends and developments in PFM.
ISSN:2041-1723
2041-1723
DOI:10.1038/s41467-019-09650-8