Ruddlesden–Popper Faults in NdNiO3 Thin Films

The NdNiO3 (NNO) system has attracted a considerable amount of attention owing to the discovery of superconductivity in Nd0.8Sr0.2NiO2. In rare-earth nickelates, Ruddlesden–Popper (RP) faults play a significant role in functional properties, motivating our exploration of its microstructural characte...

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Bibliographic Details
Published in:Symmetry (Basel) 2022-03, Vol.14 (3), p.464
Main Authors: Yang, Chao, Wang, Yi, Putzky, Daniel, Sigle, Wilfried, Wang, Hongguang, Ortiz, Roberto A., Logvenov, Gennady, Benckiser, Eva, Keimer, Bernhard, van Aken, Peter A.
Format: Article
Language:English
Subjects:
EELS
Electric properties
Electronic structure
Epitaxial growth
Faults
HAADF image
Lattice parameters
Microstructure
Misfit dislocations
Molecular beam epitaxy
NNO thin films
Rare earth elements
Ruddlesden–Popper faults
Scanning transmission electron microscopy
Substrates
Superconductivity
Thin films
Transmission electron microscopy
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Summary:The NdNiO3 (NNO) system has attracted a considerable amount of attention owing to the discovery of superconductivity in Nd0.8Sr0.2NiO2. In rare-earth nickelates, Ruddlesden–Popper (RP) faults play a significant role in functional properties, motivating our exploration of its microstructural characteristics and the electronic structure. Here, we employed aberration-corrected scanning transmission electron microscopy and spectroscopy to study a NdNiO3 film grown by layer-by-layer molecular beam epitaxy (MBE). We found RP faults with multiple configurations in high-angle annular dark-field images. Elemental intermixing occurs at the SrTiO3–NdNiO3 interface and in the RP fault regions. Quantitative analysis of the variation in lattice constants indicates that large strains exist around the substrate–film interface. We demonstrate that the Ni valence change around RP faults is related to a strain and structure variation. This work provides insights into the microstructure and electronic-structure modifications around RP faults in nickelates.
ISSN:2073-8994
2073-8994
DOI:10.3390/sym14030464