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Study on self‐assembly of colloidal particles at high ionic strength with stimulated emission depletion microscopy
Understanding the spatial organization of nano‐ and micro‐sized particle is very important in the fabrication of complex structures having unprecedented properties. Study on self‐assembly of submicroscopic colloidal particles at high ionic strength solution at single particle resolution can provide...
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Published in: | Engineering reports (Hoboken, N.J.) N.J.), 2020-09, Vol.2 (9), p.n/a |
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description | Understanding the spatial organization of nano‐ and micro‐sized particle is very important in the fabrication of complex structures having unprecedented properties. Study on self‐assembly of submicroscopic colloidal particles at high ionic strength solution at single particle resolution can provide new insight into the nanoscale interactions. In this study, we studied the self assembly behavior of negatively charged 0.2 and 1 μm colloidal particles at high ionic strength on glass‐solution interface that is, in situ environment. The self‐assembled 0.2 μm particles could not be resolved with conventional confocal and epi‐fluorescent microscopy, so a home‐built continuous wave stimulated emission depletion (STED) microscope was used for the study. We found that particles self‐assemble into ordered and disordered structures at higher and lower ionic strength solution, respectively. The optical imaging methods allowed us to measure inter‐particle gap at second energy minimum directly. Interestingly, we found that the inter‐particle gap in the wet self‐assembly higher than the classical Derjaguin, Landau, Verwey, and Overbeek (DLVO) theory predicted. The in situ investigation of particle self‐assembly at high ionic strength will provide more insight for the understanding nanoscale interactions.
Highly charged polystyrene colloidal particles show completely different self‐assembling behaviour under wet conditions than being dried on substrate surface. The self‐assembly pattern is found to different at different ionic strength. We found that particles self‐assemble into ordered and disordered structures at higher and lower ionic strength solution, respectively. |
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Highly charged polystyrene colloidal particles show completely different self‐assembling behaviour under wet conditions than being dried on substrate surface. The self‐assembly pattern is found to different at different ionic strength. We found that particles self‐assemble into ordered and disordered structures at higher and lower ionic strength solution, respectively.</description><identifier>ISSN: 2577-8196</identifier><identifier>EISSN: 2577-8196</identifier><identifier>DOI: 10.1002/eng2.12233</identifier><language>eng</language><publisher>Hoboken, USA: John Wiley & Sons, Inc</publisher><subject>Colloids ; Continuous radiation ; Depletion ; DLVO theory ; Emission analysis ; Fluorescence ; ionic strength ; Ions ; Microscopy ; Nanoparticles ; negatively charged ; resolution ; Scanning electron microscopy ; Self-assembly ; Solvents ; Stimulated emission ; stimulated emission depletion</subject><ispartof>Engineering reports (Hoboken, N.J.), 2020-09, Vol.2 (9), p.n/a</ispartof><rights>2020 The Authors. published by John Wiley & Sons, Ltd.</rights><rights>2020. This work is published under http://creativecommons.org/licenses/by/4.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c4033-a15b9742ec05b8b6ecc23efaa4d480e61bc0294ebc3a7cf200a255072da8cd7e3</citedby><cites>FETCH-LOGICAL-c4033-a15b9742ec05b8b6ecc23efaa4d480e61bc0294ebc3a7cf200a255072da8cd7e3</cites><orcidid>0000-0003-0731-2552</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://www.proquest.com/docview/2835706565/fulltextPDF?pq-origsite=primo$$EPDF$$P50$$Gproquest$$Hfree_for_read</linktopdf><linktohtml>$$Uhttps://www.proquest.com/docview/2835706565?pq-origsite=primo$$EHTML$$P50$$Gproquest$$Hfree_for_read</linktohtml><link.rule.ids>314,776,780,11542,25732,27903,27904,36991,44569,46030,46454,74872</link.rule.ids></links><search><creatorcontrib>Neupane, Bhanu B.</creatorcontrib><creatorcontrib>Zhong, Yaning</creatorcontrib><creatorcontrib>Wang, Gufeng</creatorcontrib><title>Study on self‐assembly of colloidal particles at high ionic strength with stimulated emission depletion microscopy</title><title>Engineering reports (Hoboken, N.J.)</title><description>Understanding the spatial organization of nano‐ and micro‐sized particle is very important in the fabrication of complex structures having unprecedented properties. Study on self‐assembly of submicroscopic colloidal particles at high ionic strength solution at single particle resolution can provide new insight into the nanoscale interactions. In this study, we studied the self assembly behavior of negatively charged 0.2 and 1 μm colloidal particles at high ionic strength on glass‐solution interface that is, in situ environment. The self‐assembled 0.2 μm particles could not be resolved with conventional confocal and epi‐fluorescent microscopy, so a home‐built continuous wave stimulated emission depletion (STED) microscope was used for the study. We found that particles self‐assemble into ordered and disordered structures at higher and lower ionic strength solution, respectively. The optical imaging methods allowed us to measure inter‐particle gap at second energy minimum directly. Interestingly, we found that the inter‐particle gap in the wet self‐assembly higher than the classical Derjaguin, Landau, Verwey, and Overbeek (DLVO) theory predicted. The in situ investigation of particle self‐assembly at high ionic strength will provide more insight for the understanding nanoscale interactions.
Highly charged polystyrene colloidal particles show completely different self‐assembling behaviour under wet conditions than being dried on substrate surface. The self‐assembly pattern is found to different at different ionic strength. We found that particles self‐assemble into ordered and disordered structures at higher and lower ionic strength solution, respectively.</description><subject>Colloids</subject><subject>Continuous radiation</subject><subject>Depletion</subject><subject>DLVO theory</subject><subject>Emission analysis</subject><subject>Fluorescence</subject><subject>ionic strength</subject><subject>Ions</subject><subject>Microscopy</subject><subject>Nanoparticles</subject><subject>negatively charged</subject><subject>resolution</subject><subject>Scanning electron microscopy</subject><subject>Self-assembly</subject><subject>Solvents</subject><subject>Stimulated emission</subject><subject>stimulated emission depletion</subject><issn>2577-8196</issn><issn>2577-8196</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><sourceid>24P</sourceid><sourceid>PIMPY</sourceid><sourceid>DOA</sourceid><recordid>eNp9kc1KJDEQx5tFYUW97BME9rYwmo9Op_u4iKsDooddzyEflZkM6UlvkkHm5iP4jD6JGVuWPXmpKopf_auKf9N8I_iCYEwvYbuiF4RSxr40J5QLsejJ0B39V39tznPe4AoTQTDDJ035XXZ2j-IWZQju9flF5QyjDrXlkIkhRG9VQJNKxZsAGamC1n61Rj5uvUG5pLq1rNGTryEXP-6CKmARjD7nyiALU4ByqEZvUswmTvuz5tipkOH8I582j7-u_1zdLu4ebpZXP-8WpsWMLRThehAtBYO57nUHxlAGTqnWtj2GjmiD6dCCNkwJ4yjGinKOBbWqN1YAO22Ws66NaiOn5EeV9jIqL98bMa3kx18SDz1g45weSN8abXrrhoETJ6xmQvOuan2ftaYU_-4gF7mJu7St50vaMy5wxzteqR8zdXg1J3D_thIsDybJg0ny3aQKkxl-8gH2n5Dy-v6GzjNvoE6XHQ</recordid><startdate>202009</startdate><enddate>202009</enddate><creator>Neupane, Bhanu B.</creator><creator>Zhong, Yaning</creator><creator>Wang, Gufeng</creator><general>John Wiley & Sons, Inc</general><general>Wiley</general><scope>24P</scope><scope>WIN</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>HCIFZ</scope><scope>L6V</scope><scope>M7S</scope><scope>PIMPY</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>PTHSS</scope><scope>DOA</scope><orcidid>https://orcid.org/0000-0003-0731-2552</orcidid></search><sort><creationdate>202009</creationdate><title>Study on self‐assembly of colloidal particles at high ionic strength with stimulated emission depletion microscopy</title><author>Neupane, Bhanu B. ; Zhong, Yaning ; Wang, Gufeng</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c4033-a15b9742ec05b8b6ecc23efaa4d480e61bc0294ebc3a7cf200a255072da8cd7e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><topic>Colloids</topic><topic>Continuous radiation</topic><topic>Depletion</topic><topic>DLVO theory</topic><topic>Emission analysis</topic><topic>Fluorescence</topic><topic>ionic strength</topic><topic>Ions</topic><topic>Microscopy</topic><topic>Nanoparticles</topic><topic>negatively charged</topic><topic>resolution</topic><topic>Scanning electron microscopy</topic><topic>Self-assembly</topic><topic>Solvents</topic><topic>Stimulated emission</topic><topic>stimulated emission depletion</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Neupane, Bhanu B.</creatorcontrib><creatorcontrib>Zhong, Yaning</creatorcontrib><creatorcontrib>Wang, Gufeng</creatorcontrib><collection>Wiley Online Library Open Access</collection><collection>Wiley Online Library Open Access</collection><collection>CrossRef</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central (Alumni)</collection><collection>ProQuest Central</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Engineering Collection</collection><collection>Engineering Database</collection><collection>Publicly Available Content Database</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Engineering Collection</collection><collection>Directory of Open Access Journals(OpenAccess)</collection><jtitle>Engineering reports (Hoboken, N.J.)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Neupane, Bhanu B.</au><au>Zhong, Yaning</au><au>Wang, Gufeng</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Study on self‐assembly of colloidal particles at high ionic strength with stimulated emission depletion microscopy</atitle><jtitle>Engineering reports (Hoboken, N.J.)</jtitle><date>2020-09</date><risdate>2020</risdate><volume>2</volume><issue>9</issue><epage>n/a</epage><issn>2577-8196</issn><eissn>2577-8196</eissn><abstract>Understanding the spatial organization of nano‐ and micro‐sized particle is very important in the fabrication of complex structures having unprecedented properties. Study on self‐assembly of submicroscopic colloidal particles at high ionic strength solution at single particle resolution can provide new insight into the nanoscale interactions. In this study, we studied the self assembly behavior of negatively charged 0.2 and 1 μm colloidal particles at high ionic strength on glass‐solution interface that is, in situ environment. The self‐assembled 0.2 μm particles could not be resolved with conventional confocal and epi‐fluorescent microscopy, so a home‐built continuous wave stimulated emission depletion (STED) microscope was used for the study. We found that particles self‐assemble into ordered and disordered structures at higher and lower ionic strength solution, respectively. The optical imaging methods allowed us to measure inter‐particle gap at second energy minimum directly. Interestingly, we found that the inter‐particle gap in the wet self‐assembly higher than the classical Derjaguin, Landau, Verwey, and Overbeek (DLVO) theory predicted. The in situ investigation of particle self‐assembly at high ionic strength will provide more insight for the understanding nanoscale interactions.
Highly charged polystyrene colloidal particles show completely different self‐assembling behaviour under wet conditions than being dried on substrate surface. The self‐assembly pattern is found to different at different ionic strength. We found that particles self‐assemble into ordered and disordered structures at higher and lower ionic strength solution, respectively.</abstract><cop>Hoboken, USA</cop><pub>John Wiley & Sons, Inc</pub><doi>10.1002/eng2.12233</doi><tpages>12</tpages><orcidid>https://orcid.org/0000-0003-0731-2552</orcidid><oa>free_for_read</oa></addata></record> |
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subjects | Colloids Continuous radiation Depletion DLVO theory Emission analysis Fluorescence ionic strength Ions Microscopy Nanoparticles negatively charged resolution Scanning electron microscopy Self-assembly Solvents Stimulated emission stimulated emission depletion |
title | Study on self‐assembly of colloidal particles at high ionic strength with stimulated emission depletion microscopy |
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