Locally-enhanced light scattering by a monocrystalline silicon wafer

We study the optical properties of light scattering by a monocrystalline silicon wafer, by using transparent material to replicate its surface structure and illuminating a fabricated sample with a laser source. The experimental results show that the scattering field contains four spots of concentrat...

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Bibliographic Details
Published in:AIP advances 2018-03, Vol.8 (3), p.035007-035007-6
Main Authors: Ma, Li, Zhang, Pan, Li, Zhen-Hua, Liu, Chun-Xiang, Li, Xing, Zhan, Zi-Jun, Ren, Xiao-Rong, He, Chang-Wei, Chen, Chao, Cheng, Chuan-Fu
Format: Article
Language:English
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Summary:We study the optical properties of light scattering by a monocrystalline silicon wafer, by using transparent material to replicate its surface structure and illuminating a fabricated sample with a laser source. The experimental results show that the scattering field contains four spots of concentrated intensity with high local energy, and these spots are distributed at the four vertices of a square with lines of intensity linking adjacent spots. After discussing simulations of and theory about the formation of this light scattering, we conclude that the scattering field is formed by the effects of both geometrical optics and physical optics. Moreover, we calculate the central angle of the spots in the light field, and the result indicates that the locally-enhanced intensity spots have a definite scattering angle. These results may possibly provide a method for improving energy efficiency within mono-Si based solar cells.
ISSN:2158-3226
2158-3226
DOI:10.1063/1.5020181