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Probing the (de)activation of Raney nickel–iron anodes during alkaline water electrolysis by accelerated deactivation testing
[Display omitted] •Causes of Raney Ni-Fe electrode (de)activation in OER environments were examined.•Electrodes were subjected to accelerated deactivation tests under three conditions.•Zn/Fe leaching & NiO/Ni-Fe hydroxide formation were identified as influence factors.•Clues for enhancing Raney...
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Published in: | Electrochemistry communications 2023-12, Vol.157, p.107601, Article 107601 |
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Main Authors: | , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | [Display omitted]
•Causes of Raney Ni-Fe electrode (de)activation in OER environments were examined.•Electrodes were subjected to accelerated deactivation tests under three conditions.•Zn/Fe leaching & NiO/Ni-Fe hydroxide formation were identified as influence factors.•Clues for enhancing Raney Ni–based electrode durability & performance were provided.
We investigated the (de)activation of Raney nickel–iron anodes in various oxygen evolution reaction (OER) environments using accelerated deactivation testing (ADT) under the conditions of on/off voltage control (ADT1), constant current density (ADT2), and cyclic voltammetry (ADT3). ADT1 caused activation under OER conditions by promoting the leaching of residual zinc and thus increasing the electrode surface area and oxygen vacancy content, whereas deactivation was observed under the conditions of the hydrogen evolution reaction(H-ADT1). ADT2 decreased the OER activity by promoting NiO formation and iron leaching, while ADT3 slightly increased the OER activity by favoring the incorporation of iron into the nickel lattice and promoting nickel–iron hydroxide formation. Thus, this work facilitates the design of more efficient and durable Raney nickel–based OER anodes by providing insights into their (de)activation mechanisms. |
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ISSN: | 1388-2481 1873-1902 |
DOI: | 10.1016/j.elecom.2023.107601 |