Loading…
Mechanism of Current Performance in Thin-Film Heterojunctions n-CdS/p-Sb2Se3 Obtained by the CMBD Method
In this work, we analyzed the temperature dependence of the current-voltage characteristics of the structure of glass/Mo/p-Sb2Se3/n-CdS/In. From an analysis of the temperature dependences of the direct branches of the I-V characteristic of the heterojunction, it was established that the dominant mec...
Saved in:
Published in: | East European journal of physics 2024-12 (4) |
---|---|
Main Authors: | , , , , , , , , , |
Format: | Article |
Language: | eng ; ukr |
Subjects: | |
Online Access: | Get full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
cited_by | |
---|---|
cites | |
container_end_page | |
container_issue | 4 |
container_start_page | |
container_title | East European journal of physics |
container_volume | |
creator | Т.М. Разиков К.М. Кучкаров А.А. Насіров М.П. Пірімматов Р.Р. Хуррамов Р.Т. Юлдашев Д.З. Ісаков М.А. Махмудов Ш.М. Бобомурадов К.Ф. Шахрієв |
description | In this work, we analyzed the temperature dependence of the current-voltage characteristics of the structure of glass/Mo/p-Sb2Se3/n-CdS/In. From an analysis of the temperature dependences of the direct branches of the I-V characteristic of the heterojunction, it was established that the dominant mechanism of current transfer at low biases (3kT/e |
doi_str_mv | 10.26565/2312-4334-2024-4-29 |
format | article |
fullrecord | <record><control><sourceid>doaj</sourceid><recordid>TN_cdi_doaj_primary_oai_doaj_org_article_19b06f4f56414514a62e3bc347c6ff4b</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><doaj_id>oai_doaj_org_article_19b06f4f56414514a62e3bc347c6ff4b</doaj_id><sourcerecordid>oai_doaj_org_article_19b06f4f56414514a62e3bc347c6ff4b</sourcerecordid><originalsourceid>FETCH-LOGICAL-d151t-e43c0882af5d91719ca58679bf50678fe0a43691211806a3ad847b674071207b3</originalsourceid><addsrcrecordid>eNo1jMtOAjEARSdGE4nyBy76A5W-O13qKEICwQRcT9pO65QwLemUBX8vEV2dm5OTW1VPGD0TwQWfEYoJZJQySBBh8AJ1U02ullN1-78vxX01Hcc9QoggTGuuJlW_drbXMYwDSB40p5xdLODTZZ_yoKN1IESw60OE83AYwMIVl9P-FG0JKY4gwqbbzo5wa8jWUbAxRYfoOmDOoPQONOvXN7B2pU_dY3Xn9WF00z8-VF_z912zgKvNx7J5WcEOc1ygY9Siuiba805hiZXVvBZSGc-RkLV3SDMqFCYY10hoqruaSSMkQxITJA19qJbX3y7pfXvMYdD53CYd2l-R8nercwn24FqsDBKeeS4YZhwzLYijxlImrfCeGfoD2RpkiA</addsrcrecordid><sourcetype>Open Website</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Mechanism of Current Performance in Thin-Film Heterojunctions n-CdS/p-Sb2Se3 Obtained by the CMBD Method</title><source>EZB Electronic Journals Library</source><creator>Т.М. Разиков ; К.М. Кучкаров ; А.А. Насіров ; М.П. Пірімматов ; Р.Р. Хуррамов ; Р.Т. Юлдашев ; Д.З. Ісаков ; М.А. Махмудов ; Ш.М. Бобомурадов ; К.Ф. Шахрієв</creator><creatorcontrib>Т.М. Разиков ; К.М. Кучкаров ; А.А. Насіров ; М.П. Пірімматов ; Р.Р. Хуррамов ; Р.Т. Юлдашев ; Д.З. Ісаков ; М.А. Махмудов ; Ш.М. Бобомурадов ; К.Ф. Шахрієв</creatorcontrib><description>In this work, we analyzed the temperature dependence of the current-voltage characteristics of the structure of glass/Mo/p-Sb2Se3/n-CdS/In. From an analysis of the temperature dependences of the direct branches of the I-V characteristic of the heterojunction, it was established that the dominant mechanism of current transfer at low biases (3kT/e<V<0.8V) is multi-stage tunneling-recombination processes involving surface states at the Sb2Se3/CdS interface. At V>0.8 V, the dominant current transfer mechanism is Newman tunneling. In the case of reverse bias (3kT/e<V<1.0 eV), the main mechanism of charge carrier transfer through a heterojunction is tunneling through a potential barrier involving a deep energy level. At higher reverse voltages, a soft breakdown occurs.</description><identifier>ISSN: 2312-4334</identifier><identifier>EISSN: 2312-4539</identifier><identifier>DOI: 10.26565/2312-4334-2024-4-29</identifier><language>eng ; ukr</language><publisher>V.N. Karazin Kharkiv National University Publishing</publisher><subject>CMBO ; Heterojunction ; Heterostructure ; Sb2Se3 SCR ; Thin films</subject><ispartof>East European journal of physics, 2024-12 (4)</ispartof><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Т.М. Разиков</creatorcontrib><creatorcontrib>К.М. Кучкаров</creatorcontrib><creatorcontrib>А.А. Насіров</creatorcontrib><creatorcontrib>М.П. Пірімматов</creatorcontrib><creatorcontrib>Р.Р. Хуррамов</creatorcontrib><creatorcontrib>Р.Т. Юлдашев</creatorcontrib><creatorcontrib>Д.З. Ісаков</creatorcontrib><creatorcontrib>М.А. Махмудов</creatorcontrib><creatorcontrib>Ш.М. Бобомурадов</creatorcontrib><creatorcontrib>К.Ф. Шахрієв</creatorcontrib><title>Mechanism of Current Performance in Thin-Film Heterojunctions n-CdS/p-Sb2Se3 Obtained by the CMBD Method</title><title>East European journal of physics</title><description>In this work, we analyzed the temperature dependence of the current-voltage characteristics of the structure of glass/Mo/p-Sb2Se3/n-CdS/In. From an analysis of the temperature dependences of the direct branches of the I-V characteristic of the heterojunction, it was established that the dominant mechanism of current transfer at low biases (3kT/e<V<0.8V) is multi-stage tunneling-recombination processes involving surface states at the Sb2Se3/CdS interface. At V>0.8 V, the dominant current transfer mechanism is Newman tunneling. In the case of reverse bias (3kT/e<V<1.0 eV), the main mechanism of charge carrier transfer through a heterojunction is tunneling through a potential barrier involving a deep energy level. At higher reverse voltages, a soft breakdown occurs.</description><subject>CMBO</subject><subject>Heterojunction</subject><subject>Heterostructure</subject><subject>Sb2Se3 SCR</subject><subject>Thin films</subject><issn>2312-4334</issn><issn>2312-4539</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2024</creationdate><recordtype>article</recordtype><sourceid>DOA</sourceid><recordid>eNo1jMtOAjEARSdGE4nyBy76A5W-O13qKEICwQRcT9pO65QwLemUBX8vEV2dm5OTW1VPGD0TwQWfEYoJZJQySBBh8AJ1U02ullN1-78vxX01Hcc9QoggTGuuJlW_drbXMYwDSB40p5xdLODTZZ_yoKN1IESw60OE83AYwMIVl9P-FG0JKY4gwqbbzo5wa8jWUbAxRYfoOmDOoPQONOvXN7B2pU_dY3Xn9WF00z8-VF_z912zgKvNx7J5WcEOc1ygY9Siuiba805hiZXVvBZSGc-RkLV3SDMqFCYY10hoqruaSSMkQxITJA19qJbX3y7pfXvMYdD53CYd2l-R8nercwn24FqsDBKeeS4YZhwzLYijxlImrfCeGfoD2RpkiA</recordid><startdate>20241201</startdate><enddate>20241201</enddate><creator>Т.М. Разиков</creator><creator>К.М. Кучкаров</creator><creator>А.А. Насіров</creator><creator>М.П. Пірімматов</creator><creator>Р.Р. Хуррамов</creator><creator>Р.Т. Юлдашев</creator><creator>Д.З. Ісаков</creator><creator>М.А. Махмудов</creator><creator>Ш.М. Бобомурадов</creator><creator>К.Ф. Шахрієв</creator><general>V.N. Karazin Kharkiv National University Publishing</general><scope>DOA</scope></search><sort><creationdate>20241201</creationdate><title>Mechanism of Current Performance in Thin-Film Heterojunctions n-CdS/p-Sb2Se3 Obtained by the CMBD Method</title><author>Т.М. Разиков ; К.М. Кучкаров ; А.А. Насіров ; М.П. Пірімматов ; Р.Р. Хуррамов ; Р.Т. Юлдашев ; Д.З. Ісаков ; М.А. Махмудов ; Ш.М. Бобомурадов ; К.Ф. Шахрієв</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-d151t-e43c0882af5d91719ca58679bf50678fe0a43691211806a3ad847b674071207b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng ; ukr</language><creationdate>2024</creationdate><topic>CMBO</topic><topic>Heterojunction</topic><topic>Heterostructure</topic><topic>Sb2Se3 SCR</topic><topic>Thin films</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Т.М. Разиков</creatorcontrib><creatorcontrib>К.М. Кучкаров</creatorcontrib><creatorcontrib>А.А. Насіров</creatorcontrib><creatorcontrib>М.П. Пірімматов</creatorcontrib><creatorcontrib>Р.Р. Хуррамов</creatorcontrib><creatorcontrib>Р.Т. Юлдашев</creatorcontrib><creatorcontrib>Д.З. Ісаков</creatorcontrib><creatorcontrib>М.А. Махмудов</creatorcontrib><creatorcontrib>Ш.М. Бобомурадов</creatorcontrib><creatorcontrib>К.Ф. Шахрієв</creatorcontrib><collection>DOAJ Directory of Open Access Journals</collection><jtitle>East European journal of physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Т.М. Разиков</au><au>К.М. Кучкаров</au><au>А.А. Насіров</au><au>М.П. Пірімматов</au><au>Р.Р. Хуррамов</au><au>Р.Т. Юлдашев</au><au>Д.З. Ісаков</au><au>М.А. Махмудов</au><au>Ш.М. Бобомурадов</au><au>К.Ф. Шахрієв</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Mechanism of Current Performance in Thin-Film Heterojunctions n-CdS/p-Sb2Se3 Obtained by the CMBD Method</atitle><jtitle>East European journal of physics</jtitle><date>2024-12-01</date><risdate>2024</risdate><issue>4</issue><issn>2312-4334</issn><eissn>2312-4539</eissn><abstract>In this work, we analyzed the temperature dependence of the current-voltage characteristics of the structure of glass/Mo/p-Sb2Se3/n-CdS/In. From an analysis of the temperature dependences of the direct branches of the I-V characteristic of the heterojunction, it was established that the dominant mechanism of current transfer at low biases (3kT/e<V<0.8V) is multi-stage tunneling-recombination processes involving surface states at the Sb2Se3/CdS interface. At V>0.8 V, the dominant current transfer mechanism is Newman tunneling. In the case of reverse bias (3kT/e<V<1.0 eV), the main mechanism of charge carrier transfer through a heterojunction is tunneling through a potential barrier involving a deep energy level. At higher reverse voltages, a soft breakdown occurs.</abstract><pub>V.N. Karazin Kharkiv National University Publishing</pub><doi>10.26565/2312-4334-2024-4-29</doi><oa>free_for_read</oa></addata></record> |
fulltext | fulltext |
identifier | ISSN: 2312-4334 |
ispartof | East European journal of physics, 2024-12 (4) |
issn | 2312-4334 2312-4539 |
language | eng ; ukr |
recordid | cdi_doaj_primary_oai_doaj_org_article_19b06f4f56414514a62e3bc347c6ff4b |
source | EZB Electronic Journals Library |
subjects | CMBO Heterojunction Heterostructure Sb2Se3 SCR Thin films |
title | Mechanism of Current Performance in Thin-Film Heterojunctions n-CdS/p-Sb2Se3 Obtained by the CMBD Method |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-01T19%3A25%3A49IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-doaj&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Mechanism%20of%20Current%20Performance%20in%20Thin-Film%20Heterojunctions%20n-CdS/p-Sb2Se3%20Obtained%20by%20the%20CMBD%20Method&rft.jtitle=East%20European%20journal%20of%20physics&rft.au=%D0%A2.%D0%9C.%20%D0%A0%D0%B0%D0%B7%D0%B8%D0%BA%D0%BE%D0%B2&rft.date=2024-12-01&rft.issue=4&rft.issn=2312-4334&rft.eissn=2312-4539&rft_id=info:doi/10.26565/2312-4334-2024-4-29&rft_dat=%3Cdoaj%3Eoai_doaj_org_article_19b06f4f56414514a62e3bc347c6ff4b%3C/doaj%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-d151t-e43c0882af5d91719ca58679bf50678fe0a43691211806a3ad847b674071207b3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |