Design of a Waveguide Calibration Kit Consisting of Offset Shorts for Low Measurement Uncertainty

• Published in: IEEE access 2024, Vol.12, p.12902-12908
• Main Authors: Cho, Chihyun, Kwon, Jae-Yong, Kang, Tae-Weon, Koo, Hyunji, Chung, Woohyun
• Format: Article
• Language: English
• Subjects: Calibration; Frequencies; Impedance; measurement uncertainty; Network analysers; network analyzers; optimization; Reproducibility; Uncertainty; Waveguides
• ISSN: 2169-3536; 2169-3536
• DOI: 10.1109/ACCESS.2024.3355496

We recently established an impedance standard for the D-band, one of the 6G candidate frequencies. However, primary standards are difficult to use for routine calibration because they require multiple impedance standards and a lot of time to calibrate the vector network analyzer (VNA). Therefore, a transfer standard is needed to efficiently apply the calibration value and to propagate the uncertainty of the primary standard to a device under test (DUT). In this paper, we describe a design method for a transfer standard with small uncertainty even when an arbitrary DUT is measured. This is achieved by propagating the uncertainty of the primary standard to the transfer standard and then propagating it again to the uncertainty of the DUT. We developed a calibration kit that has low uncertainty over a wide frequency band, from 110 GHz to 170 GHz, and consists of waveguide offset shorts for ease of production. We also propose a method to minimize DUT uncertainty and a method to minimize “phase distance” to find the optimal length of the offset short. When using three offset shorts, an uncertainty similar to that of the short-open-load-thru (SOLT) calibration kit was obtained, and when using four offset shorts, an uncertainty comparable to the primary standard was obtained. Lastly, this paper examines the repeatability of measurements and reproducibility during the production process.