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A mathematical model for investigation of dry band location on 22 kV bushing with and without RTV coating: Experimental study
As different pollutants are deposited on the high voltage bushings, a dry band forms, which causes a flashover. The bushing's contaminated layer will weaken its insulation and have an impact on its electrical characteristics. The performance of bushings in dry band conditions of various lengths...
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Published in: | MethodsX 2024-06, Vol.12, p.102579-102579, Article 102579 |
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Main Authors: | , , , , , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites |
Online Access: | Get full text |
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Summary: | As different pollutants are deposited on the high voltage bushings, a dry band forms, which causes a flashover. The bushing's contaminated layer will weaken its insulation and have an impact on its electrical characteristics. The performance of bushings in dry band conditions of various lengths was investigated in this proposed piece of work, and a dynamic arc model is presented for the arc process in polluted bushings. It shows satisfactory performance in modelling the arc variables for various dry band positions. The developed dynamic open model for contaminated bushings with and without RTV coating predicted the flashover voltage and dry band positions. Any type of contamination, such as sea salt, road salt, and industrial pollutants prevalent in several sites, can be studied using the established model. Ultimately, it was discovered that there was good agreement between the model's results and the outcomes of the experiments.
•Mathematical modeling of 22 kV bushing is conceded out for diverse polluted dry band location at lead-in, lead-out and middle region of bushing surface.•Dynamic arc modeling involved in bushing flashover process for different dry band location is done and flashover voltage is predicted•Experimental work is carried out to find FOV for the bushing with different dry location and compared with predicted FOV.
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ISSN: | 2215-0161 2215-0161 |
DOI: | 10.1016/j.mex.2024.102579 |