Tamm Plasmon Polaritons Hydrogen Sensors

Tamm plasmon polariton (TPP) resonance can be excited within the stopband of a distributed Bragg reflector (DBR) by combining a thin metal film. When exposured to hydrogen gas, the TPP resonance feature is redshifted for the TPPs structure with palladium (Pd) on the top, due to hydrogen‐induced pall...

Full description

Saved in:
Bibliographic Details
Published in:Advanced Physics Research 2023-08, Vol.2 (8), p.n/a
Main Authors: Chen, Yu‐Sheng, Yang, Zih‐Ying, Ye, Ming‐Jyun, Wu, Wen‐Hsiang, Chen, Lu‐Hsing, Shen, Hung‐Jung, Ishii, Satoshi, Nagao, Tadaaki, Chen, Kuo‐Ping
Format: Article
Language:English
Subjects:
Bragg reflectors
Catalysis
Chemical sensors
Clean technology
Glass substrates
Hydrogen
Hydrogenation
Metal films
Metal oxides
Palladium
Phase transitions
Plasmons
Polaritons
Reflectance
Resonance
Sensors
Simulation
Tamm plasmon polaritons
Thin films
Wavelengths
Zinc oxides
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Tamm plasmon polariton (TPP) resonance can be excited within the stopband of a distributed Bragg reflector (DBR) by combining a thin metal film. When exposured to hydrogen gas, the TPP resonance feature is redshifted for the TPPs structure with palladium (Pd) on the top, due to hydrogen‐induced palladium lattice expansion. By utilizing a DBR‐side TPP structure, near‐zero reflectance can be achieved, leading to more than 3 orders of magnitude changes in reflectance compared to metal‐side TPP structure. The proposed TPP hydrogen structure enables the detection with low H2 concentration from 0.5% to 4%. Comparing to the only Pd film, TPP sensor has increased the sensitivity about 100% at visible wavelengths. Tamm plasmon polariton (TPP) resonance with a palladium (Pd) thin film is proposed for use in optical hydrogen sensors. With optimized design, near‐zero reflectance can be achieved by TPP resonance, leading to more than 3 orders of magnitude changes in reflectance compared to the pure Pd film.
ISSN:2751-1200
2751-1200
DOI:10.1002/apxr.202200094